Board for measuring parallelism between surfaces of upper and lower surface plates, system for measuring parallelism between surfaces of upper and lower surface plates, and method for adjusting distan
A measuring system and parallelism technology, which is applied in the field of adjusting the surface distance of the upper and lower die bases, can solve the problems of troublesome compensation operations, inability to measure parallelism, etc., and achieve the effect of simple processing.
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[0053] The present invention will be described with reference to the accompanying drawings. figure 1 - Fig. 4 is an explanatory view showing a first embodiment of the plate for measuring the parallelism of the upper and lower die base surfaces of the present invention. figure 1 Fig. 2 is an explanatory view showing a plate for measuring the parallelism of the upper and lower die base surfaces (Fig. 2(A) is a side explanatory view, and Fig. 2(B) is a top view explanatory view); Fig. 3 It is an enlarged explanatory diagram of the measurement unit (Fig. 3(A) is a side explanatory diagram, and Fig. 3(B) is a top view explanatory diagram); Fig. 4 is an explanatory diagram of the action of the measurement unit (Fig. Figure 4 (B) is the figure after the displacement of the displacement member).
[0054] The plate 1 for measuring the parallelism of the upper and lower mold base surfaces is used to measure the parallelism between the upper mold base 21 and the lower mold base 22 of ...
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