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Non-volatile memory devices including dummy word lines and related structures and methods

A non-volatile storage, virtual word line technology, applied in the field of electronic equipment, can solve problems such as the existence of needs

Active Publication Date: 2011-04-13
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Although non-volatile memory devices are known, there remains a need for techniques that provide structures and methods of more highly integrated memory devices

Method used

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  • Non-volatile memory devices including dummy word lines and related structures and methods
  • Non-volatile memory devices including dummy word lines and related structures and methods
  • Non-volatile memory devices including dummy word lines and related structures and methods

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Embodiment Construction

[0042] The present invention will be described more fully hereinafter with reference to the accompanying drawings, in which embodiments of the invention are shown. This invention may, however, be embodied in many different ways and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In the drawings, the size and relative sizes of layers and regions may be exaggerated for clarity. Like numbers refer to like elements throughout.

[0043] It will be understood that when an element or layer is referred to as being "on," "connected to" and / or "coupled to" another element or layer, it can be directly on the other element or layer. , directly connected or coupled to another element or layer, or intervening elements or layers may be present. In contrast, when an element is referred to as being...

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Abstract

A non-volatile memory device may include a semiconductor substrate including an active region at a surface thereof, a first memory cell string on the active region, and a second memory cell string on the active region. The first memory cell string may include a first plurality of word lines crossing the active region between a first ground select line and a first string select line, and about a same first spacing may be provided between adjacent ones of the first plurality of word lines. The second memory cell string may include a second plurality of word lines crossing the active region between a second ground select line and a second string select line, and about the same first spacing may be provided between adjacent ones of the second plurality of word lines. Moreover, the first ground select line may be between the second ground select line and the first plurality of word lines, and the second ground select line may be between the first ground select line and the second pluralityof word lines. Moreover, portions of the active region between the first and second ground select lines may be free of word lines, and a second spacing between the first and second ground select lines may be at least about 3 times greater than the first spacing. Related methods are also discussed.

Description

[0001] related application [0002] This US nonprovisional patent application claims priority under 35 U.S.C. §119 to Korean Patent Application No. 10-2006-0065040 filed on July 11, 2006, the disclosure of which is hereby incorporated by reference in its entirety. technical field [0003] The present invention relates generally to electronic devices, and more particularly to electrical storage devices and related methods. Background technique [0004] Non-volatile memory devices, such as flash memory devices, may be provided in a NOR-type structure or a NAND-type structure. For example, NOR-type flash memory devices may provide faster random access, while NAND-type flash memory devices may provide lower cost and / or higher integration. Thus NOR-type flash memory devices can be used for code memory storage, while NAND-type flash memory devices can be used for mass memory storage. [0005] For example, in US Patent No. 7,079,437 to Hasama et al., entitled "Nonvolatile Semicon...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/115H01L23/522H01L23/528H01L21/8247H01L21/768H10B69/00
CPCG11C16/3427G11C16/0483H10B63/80
Inventor 薛钟善崔正达朴泳雨朴镇泽
Owner SAMSUNG ELECTRONICS CO LTD