Method and device for reducing service interruption time

A business interruption and time technology, applied in the field of communication, can solve the problems of reducing equipment availability and operation reliability, increasing, etc., to overcome equipment failures, avoid long-term interruptions, and ensure normal operation.

Inactive Publication Date: 2008-01-16
CHANGZHOU XIAOGUO INFORMATION SERVICES
View PDF0 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the MTTR (MeanTime To Repair, average fault repair time) is increased, which reduces the availability of equipment and the reliability of operation.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for reducing service interruption time
  • Method and device for reducing service interruption time
  • Method and device for reducing service interruption time

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] A method for reducing service interruption time provided by an embodiment of the present invention is that when a device fails to start normally due to a fault, for example, the device restarts repeatedly, at this time it is judged whether the fault is caused by the ECC memory of the device, and if so, Then shut down the operation of the ECC memory; and after shutting down, trigger the restart of the device, so as to resume the service operation after startup.

[0034] Wherein, the specific realization of the said determining whether the fault is caused by the ECC memory of the device includes that the ECC memory of the device can be detected separately, or by detecting all other faults in the device except the ECC memory The RAM memory chip performs fault detection, through troubleshooting, thereby knowing the state of the ECC memory, or detecting the working state of the ECC memory by other common means, wherein any fault detection method adopted for the ECC memory doe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The embodiment in the invention discloses a method for reducing the service interruption time. When equipment can not be normally started due to faults, determine whether the faults are caused by ECC memory of the equipment or not, if yes, shut down the operation of the ECC memory; trigger the equipment to restart and thereby recover service operations after starting. Meanwhile, the embodiment in the invention also discloses a method and means for testing faults of ECC memory of the equipment. When the equipment is broken down, the invention can timely shut down the broken ECC memory tested, thereby allow the equipment to recover service operations after being restarted. Avoid a long interruption of equipment services, and reduce the service interruption time of equipment.

Description

technical field [0001] The invention relates to the technical field of communication, in particular to a method and a device for reducing service interruption time. Background technique [0002] Soft failure is based on the unique failure mode of memory devices with RAM (Random Access Memory, random access memory), which corresponds to hard failure. Hard failure is the failure of the hardware itself of the device. This situation is called a soft failure. Generally, the lower the operating voltage of the device, the narrower the process line width, or the higher the altitude of the device's working environment, the greater the probability of soft failure of the device. For example, the probability of a soft failure for a memory using 0.13 micron technology is as high as 10,000-100,000 FITs (Failures In Time, FITs) per megabit, which is equivalent to a soft failure every few months or weeks on average. [0003] At present, in order to reduce the severity caused by the soft f...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H04L1/22H04B1/74H04B17/00H04L12/24
Inventor 张志龙
Owner CHANGZHOU XIAOGUO INFORMATION SERVICES
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap