Wireless high-frequency integration test system and test method thereof

Abstract

The present invention relates a wireless high-frequency integration testing system and a testing method, the wireless high-frequency integration testing system comprises a control unit, a plurality of test units, a testing device and a testing switch unit. The present invention switches a plurality of test routes for testing wireless high-frequency products to be tested by the control units in collocation with the testing switch unit; and tests the wireless high-frequency products to be tested at random according to the testing demand of each test unit so as to reduce the expenses for purchasing the expensive testing device, to avoid mutual interference in testing a plurality of wireless high-frequency products to be tested, and to greatly reduce the unused time of the testing device and the average testing time of products to be tested.

Description

technical field [0001] The invention relates to a product testing system, in particular to a wireless high-frequency integrated testing system and a testing method thereof. Background technique [0002] In an era of fierce competition, products not only require fast time to market, but also product quality. Therefore, the speed and accuracy of product testing will affect product quality and customer satisfaction. [0003] The current method for testing wireless high-frequency products is to configure a test device that can test a number of characteristic parameters of the product to be tested on the test work platform of each product to be tested, so that the test device can be tested one-to-one. Test a single product under test to prevent mutual interference when testing multiple products under test at the same time, especially when testing wireless signal products. In order to improve the stability and accuracy of the measurement signal and speed up the test time of the p...

AI Technical Summary

Problems solved by technology

However, such a test method can only reduce the time for the operator to place the product to be tested, but it cannot solve the problem of the test device being idle for too long

[0005] In addition, due to the purchase cost of the test device and its maintenance cost, relative to the testable functionality of the test device, the more characteristic parameters that can be tested, the higher the cost

Therefore, relatively, the testable characteristic parameters of the product to be tested have to be sacrificed to achieve the purpose of reducing the test cost and shortening the test time, but on the other hand, the product quality may not be fully considered.

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