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Quality control system, analyzer, and quality control method

An analytical device and quality control technology, applied in analytical materials, laboratory analysis data, comprehensive factory control, etc., can solve the problems of not taking into account the uncertainties in the measurement data, and inability to judge the measurement samples.

Active Publication Date: 2008-03-26
SYSMEX CORP
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Problems solved by technology

[0004] However, the above-mentioned Patent Publication No. 2004-20323 does not describe a method for evaluating the uncertainty of the analysis device based on the measurement data synthesized by the above-mentioned measurement device.
Therefore, even if the measurement data uncertainty is calculated using the above-mentioned measuring device, the user of the measuring device cannot judge whether or not the specimen can be measured by the measuring device based on the value of the uncertainty.
Moreover, to calculate the uncertainty of the measured value of the unknown sample when measuring the unknown sample with the measuring device described in the above-mentioned Patent Publication No. 2004-20323, it is necessary to measure the same unknown sample several times.
However, unknown samples are usually collected from patients, and it is a great burden for patients to collect unknown samples from patients enough to perform several measurements.
[0005] The quality control system published in the above-mentioned U.S. Patent No. 6,937,964 is very useful, but it does not take into account the uncertainties contained in the measurement data

Method used

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  • Quality control system, analyzer, and quality control method

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Embodiment Construction

[0083] Preferred embodiments of the present invention will be described below with reference to the drawings.

[0084] As shown in FIG. 1 , the quality control system 10 of this embodiment includes a control device 1 and a plurality of analysis devices 3 connected to the control device 1 through a network 2 such as the Internet. The analysis device 3 may be various sample analysis devices such as a biochemical analyzer, a blood cell counter, a coagulation analyzer, an immunoassay analyzer, and a urine analyzer. The analysis device 3 connected to the control device 1 is not limited to one type, and several types such as biochemical analyzers and blood cell counters can also be connected. For the convenience of description, only a blood cell counter is used as an example for illustration. The analysis device 3 can be an analysis device that can only perform an analysis function by connecting the data processing device 4 and the analysis device host 5, or it can be an analysis de...

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Abstract

A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measuring the quality control samples; (c) implementing a quality control by the control device based on the collected quality control data; (d) obtaining uncertainty of measurement of analyzer based on uncertainty of analyzer calibration and the quality control data; (e) outputting a result of the quality control; and (f) outputting the uncertainty of measurement is disclosed. A quality control system and an analyzer are also disclosed.

Description

Technical field: [0001] The present invention relates to a quality control system, an analysis device and a quality control method, in particular to a quality control system, an analysis device and a quality control method composed of several sets of analysis devices and control equipment connected to the above several sets of analysis devices through a network . Background technique: [0002] The uncertainty of measurement data obtained by analytical devices is now well known. For example, Patent Publication No. 2004-20323 describes a measurement device that combines the uncertainty of the instrument tolerance of the detector, the uncertainty of the operation of the instrument, the uncertainty of the calibration curve when measuring the standard sample, and the uncertainty of the measurement unknown. Combining the uncertainties of the measured values ​​of unknown samples and calculating the combined uncertainty. [0003] As we all know, the current quality control system ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/418G06Q10/00G01N35/00
CPCG06F19/366G06F19/3412G16H10/40G16H40/40
Inventor 山口忠幸白上笃新改悦郎越智康浩
Owner SYSMEX CORP
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