Low consumption dielectric material high temperature complex dielectric constant test device and method

Abstract

The invention discloses a device and a method for testing high-temperature complex permittivityes of low-loss dielectric materials, which belongs to the micro-wave, millimeter wave low-loss dielectric materials complex permittivityes testing technique. The testing device comprises a micro wave signal source, a cylinder type high Q resonant cavity, a scalar network analyzer, and a vacuum high-temperature furnace, wherein the cylinder type high Q resonant cavity comprises a cylinder cavity tube, an upper end cover, a lower end cover, and a connecting wave guide, whole resonant cavity adopts thin-wall precious metals to form a cavity, and adopts high-temperature resisting material to form a supporting body. Adoption of the testing device comprises testing a resonating frequency rate of an empty cavity f0 and a non-loading quality factor Q0, and testing the resonating frequency rate f0 epsilon and the non-loading factor Q0 epsilon of a rear resonating cavity of a testing sample of a loading low-loss dielectric under the same high temperature, and calculating out the high-temperature complex permittivityes of the low-loss dielectric materials. The invention has the advantages of wide applying frequency range, high testing temperature, low cost, convenient testing, and little testing error, and is applicable to high temperature tests of the complex permittivityes of the low-loss dielectric materials in each microwave, millimeter wave frequency band range.

Description

technical field [0001] The invention belongs to the technical field of microwave and millimeter wave, in particular to the complex permittivity testing technology of microwave and millimeter wave low-loss dielectric material. Background technique [0002] Microwave and millimeter wave low-loss dielectric materials are widely used in microwave and millimeter wave devices and systems. As a basic parameter of microwave and millimeter wave media, complex permittivity and its temperature characteristics are the main basis for evaluating the performance of low-loss dielectric materials, and are also important parameters for microwave device design. In the research and application of low-loss dielectric materials and their performance evaluation, they must pass the actual test of their performance parameters. When the measured medium is an anisotropic material, the direction of the electric field in the test device should be the same as the direction of the electric field when the...

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Problems solved by technology

These test devices are complex and have low measurement accuracy, and it is difficult to adapt to the higher temperature test status of low-loss material complex dielectric constant.

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