Measurement equipment and its measurement method

A technology for measuring equipment and measuring values, applied in measuring devices, mechanical measuring devices, mechanical thickness measurement, etc., can solve problems such as low efficiency, increased work intensity of inspectors, reading errors, etc., and achieve simple measurement methods, easy operation, volume small effect

Inactive Publication Date: 2008-08-06
SHENZHEN FUTAIHONG PRECISION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the micrometer is small in size, simple in structure and easy to operate, the measurement efficiency is not only low, but it is easy to cause reading errors
More importantly, inspectors are required to judge whether the workpiece meets the standards, which increases the work intensity of inspectors

Method used

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  • Measurement equipment and its measurement method
  • Measurement equipment and its measurement method
  • Measurement equipment and its measurement method

Examples

Experimental program
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Embodiment Construction

[0016] Please refer to Fig. 1, the preferred embodiment of measuring equipment 80 of the present invention comprises a measuring instrument 10 and a data processing device 20 interconnected with this measuring instrument 10, and this measuring equipment 80 can be used for the height, width and thickness etc. of workpiece Geometric parameters are measured and indicated whether the workpiece complies with the standard.

[0017] see figure 2 , the measuring instrument 10 includes a base 14 , a guide post 16 , a slider 18 and a micrometer 12 . The base 14 is a substantially rectangular metal plate with a high flatness on its upper surface. A through hole (not shown) is opened near the edge of the upper surface. The guide post 16 is a metal rod whose cross-section is equivalent to the size of the through hole. The guide post 16 can be fixed in the through hole and perpendicular to the base 14 . The slider 18 includes a sliding portion 182 and a clamping portion 184. The sliding ...

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PUM

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Abstract

The invention provides a measuring device and a measuring method. The measuring device is used to measure geometry parameter of work piece, the measuring device comprises a measuring instrument and a data processing device, the measuring instrument comprises a base, a guide pole, a slide block and a micrometer, the guide pole is perpendicularly fixed on the base, the slide block is movably disposed on the guide pole, and the micrometer is fixed by the slide block. The data processing device is connected with the measuring instrument, and the data processing device is used to analyze the measured value which is measured by the measuring instrument, and show the measured result.

Description

technical field [0001] The invention relates to a measuring device and a measuring method thereof, in particular to a measuring device and a measuring method thereof for measuring workpiece geometric parameters. Background technique [0002] In industrial production, in order to judge whether the workpiece meets the dimensional standards, it is often necessary to measure the geometric parameters of the workpiece. At present, three-dimensional measurement technology is mainly used in this field to measure precision workpieces. The existing three-dimensional measuring instruments are relatively bulky, complex in structure, and inconvenient to move. They are only suitable for measuring a small number of workpiece samples in the laboratory, and cannot meet the requirements of large-scale measurement on the production line. [0003] In addition, in order to achieve accurate measurement, a micrometer can be used alone to measure the workpiece, and the tester can read and record i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B5/00G01B5/02G01B5/06G01B3/18
CPCG01B5/063G01B3/18G01B5/02
Inventor 李雷陈平赵云芳李冬陈志礼蒋军
Owner SHENZHEN FUTAIHONG PRECISION IND CO LTD
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