Circuit testing device

Abstract

The invention discloses a circuit testing device for testing an element to be tested. The circuit testing device comprises an accurate measurement module, a signal converting module and a microprocessor, wherein, the accurate measurement module is coupled with the element to be tested and is used for providing a test signal and receiving a measure signal generated according to the test signal; the signal converting module is coupled with the accurate measurement module and is used for receiving the measure signal and converting the measure signal according to a preset way as well as generating a signal measure result; and the microprocessor is coupled with the accurate measurement module and the signal converting module and is used for determining the testing result of the element to be tested according to the signal measure result. The circuit testing device brings convenience of test to a user, increases the speed of test and improves the efficiency of test further.

Description

technical field [0001] The present invention provides a circuit testing device, especially a circuit testing device capable of measuring decibel (dB) values ​​of components to be tested. Background technique [0002] With the advancement of technology, the functions of integrated circuits (Integrated Circuit, IC) are becoming more and more powerful, and their importance is also increasing day by day. In addition to ICs that only process analog signals and ICs that only process digital signals, the industry has also developed a variety of ICs with both digital and analog signal processing capabilities. Such ICs are generally called mixed-signal ICs. Regardless of whether it is a digital signal IC, an analog signal IC or a mixed signal IC, in order to ensure the quality of the IC when it is shipped, after the completion of the manufacturing process, each IC will generally be tested. Determine whether the IC is qualified, and judge whether the IC can be supplied to downstream ...

AI Technical Summary

Problems solved by technology

However, when the decibel (dB) value of IC is to be tested, since the general logic tester does not have the function of directly testing the decibel value of IC, it is necessary to use the logic tester to measure the output voltage of the IC first, and then The user converts the decibel value corresponding to the output voltage by himself, so that the IC can be judged as passing (Pass) decibel (dB) value test or failing (Fail)

However, the conversion of the output voltage and decibel values ​​by the user will not only consume a lengthy test time, reduce the speed of the test, but also bring great inconvenience to the user

Images