AHB bus test method and system

A technology of bus testing and bus transmission, applied in error detection/correction, detection of faulty computer hardware, instruments, etc., can solve problems such as heavy workload, low efficiency, and many SOC pins, and achieve simple effects

Inactive Publication Date: 2008-11-05
ACTIONS ZHUHAI TECH CO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0017] Disadvantage of method 1: too many SOC pins are required, even if only essential signals are mapped, mainly AHB clock signal, AHB address bus (32), AHB data bus (32), etc., there are as many as Sixty, more than seventy, not applicable to SOC with a small number of pins
[0018] Disadvantages of Method 2: According to the AMBA TIC protocol, the AHB test interface requires a total of 36 external interface signals, which are the ...

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  • AHB bus test method and system

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Embodiment Construction

[0063] The AHB bus testing method and system provided by the present invention will be described in detail below in conjunction with the accompanying drawings.

[0064] The AHB bus test method provided by the present invention is applied to the AHB bus test in the SOC, the AHB test interface is provided in the SOC, and the structure of the AHB test interface is shown in figure 2 and image 3 , the same as the prior art, the function and state transition of the AHB test interface refer to Figure 4 , used to convert the received test signal into AHB bus transmission signal for AHB bus test.

[0065] The method of the invention utilizes the AHB test interface in the prior art to complete the AHB bus test in the SOC.

[0066] see Figure 5 , AHB bus test method flowchart provided by the present invention, specifically includes:

[0067] Step S101, generating a first AHB bus transmission signal outside the SOC.

[0068] Since the AHB bus transmission signal is a bus transmis...

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Abstract

The present invention discloses an AHB bus test method and system, applied in the test to the AHB bus in the system-on-chip (SOC), which is provided with AHB test interfaces. The method includes: producing first AHB bus signals at the exterior of the SOC; converting the first AHB bus signals into the test signals, and then transmits to the AHB test interface; the AHB test interface converting the received test signals into AHB bus transmission signals to execute AHB bus test. The AHB bus test system provided by the present invention at least includes a microprocessor for producing the first AHB bus transmission signals, as well as a test interface bus encoder for receiving the first AHB bus transmission signals and converting the signals into the test signals. The present invention can simply and exactly produce the test signals with high-efficiency, and can effectively realize the test to the AHB bus in the SOC.

Description

technical field [0001] The present invention relates to AHB (Advanced High-performance Bus, advanced high-performance bus) test method and system, relate in particular to the SOC (System-on-a-chip) based on AMBA (Advanced Microcontroller Bus Architecture, advanced microcontroller bus structure) AHB architecture , AHB bus testing method and system in system on chip). Background technique [0002] figure 1 It is a typical SOC based on the AMBAAHB architecture. It mainly includes AHB bus 1, high-performance microprocessor 2, on-chip high-bandwidth RAM (Random Access Memory) 3, high-bandwidth off-chip memory interface 4, high-performance DMA (Direct Memory Access) controller 5, APB (Advanced Peripheral Bus) bridge 6, APB bus 7 and APB slave 8. figure 1 The SOC architecture diagram in the figure is a known SOC architecture, and the functions of each part are also known. The high-performance microprocessor 2 is the control center of the entire SOC, and the high-bandwidth on-chi...

Claims

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Application Information

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IPC IPC(8): G06F11/26
CPCG06F11/2733
Inventor 王惠刚
Owner ACTIONS ZHUHAI TECH CO
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