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Contact element and checkout system

A technology of contacting units and relationships, which is applied in the field of inspection systems, can solve the problems of reduced positioning accuracy, different positioning precision, and difficult objective judgment, etc., and achieves the effect of simple structure and simple composition

Inactive Publication Date: 2012-06-27
NHK SPRING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] Moreover, when positioning is performed by visually recognizing the contact part, there is a possibility that the positioning accuracy will be reduced.
That is, in the case of a structure in which positioning is performed based on the examiner's senses, it is difficult to objectively judge whether it has been correctly positioned to the extent that there is no obstacle after the inspection
In addition, when the examiner is replaced, the positioning accuracy will be different due to the difference in proficiency, so it is not appropriate.

Method used

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  • Contact element and checkout system
  • Contact element and checkout system
  • Contact element and checkout system

Examples

Experimental program
Comparison scheme
Effect test

no. 1 approach

[0056] First, the inspection system of the first embodiment will be described. figure 1 It is a schematic diagram of the overall structure of the inspection system of the first embodiment. Such as figure 1 As shown, the structure of the inspection system of the first embodiment includes: a contact unit 2 for realizing electrical connection to the inspection object 1, a signal processing device 3 for generating electrical signals input to the inspection object, and a device for The connection substrate 4 electrically connects the signal processing device 3 and the contact unit 2 .

[0057] The inspection object 1 is an object to be inspected by the inspection system of the first embodiment. Specifically, the test object 1 has a long tape-like structure, and includes a plurality of circuit formation regions 5a arranged in the longitudinal direction on a predetermined film base material, and arranged at constant intervals in the longitudinal direction near the ends in the width...

no. 2 approach

[0093] Next, the inspection system of the second embodiment will be described. In the second embodiment, when inspecting an inspection object that does not have a conductive region corresponding to a dummy pad, accurate positioning is adopted.

[0094] Figure 8 It is a schematic diagram of the overall structure of the inspection system of the second embodiment. Such as Figure 8 As shown, the inspection system according to the second embodiment has the same configuration as the signal processing device 3 and the connection board 4 as the first embodiment, and additionally installs the inspection system corresponding to the inspection object 31 that does not have a dummy pad. The structure of the contact unit 32 of the arrangement pattern of the probe group 14 . In this second embodiment, members having the same symbols and names as those in the first embodiment are assumed to have the same configuration and function as those in the first embodiment unless otherwise specifi...

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PUM

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Abstract

A contact unit which has a simple configuration and can perform precise alignment with a test object is provided. On the top surface of a holder base (15) provided to a contact unit (2), contact probes (13) are arranged correspondingly to the arrangement pattern of test pads (11) provided in a circuit-forming region (5a), which is a test object, and groups of detecting probes (14a to 14d) are arranged correspondingly to dummy pads (7a to 7d). Each group of detecting probes (14) consists of probes (19, 20) connected respectively to a light-emitting diode (12) and a voltage source (21) which constitute a positional relationship detector (22).; Since the light-emitting diode (12) emits light when the probes (19, 20) comes in contact with the corresponding dummy pad (7) to become conductive with each other in a test using the contact unit (2), whether or not the alignment has been performed precisely can be judged by checking the emission state of the light-emitting diode (12).

Description

technical field [0001] The present invention relates to an inspection object formed on the surface including a plurality of conductive regions including a wiring structure used for input or output of electrical signals, a contact unit (contact unit) electrically connected to the above-mentioned wiring structure, and its use Inspection system for contact units. Background technique [0002] In the past, for example, the driving circuit of the liquid crystal display panel constituting the liquid crystal display, etc., have used TCP (Tape Cartier Package, tape and tape) such as TAB (Tape Automated Bonding), COF (Chip On Film, grain film bonding), etc. The composition of the type package) is generally known. TCP is formed by mounting a semiconductor chip on a flexible film substrate with a wiring structure formed on the surface, and sealing the mounted semiconductor chip with resin. [0003] The TCP having such a structure is formed by forming a wiring structure corresponding ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/26G01R1/06G02F1/13
CPCG01R31/2891G01R31/2884G01R1/06G01R31/28G02F1/13
Inventor 石川重树仁平崇
Owner NHK SPRING CO LTD