Micro/nano scale ultra-micro force measuring device and force value tracing method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TIANJIN UNIV
- Publication Date
- 2008-12-10
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of ultra-small force value measurement and measurement. Background technique
[0002] With the development of modern science and technology, research on the mechanical properties of micro-scale components in micro-electromechanical systems (MEMS), observation of micro-friction phenomena, micro-force monitoring in micro-sensing micro-robot micro-assembly, liquid surface tension analysis, film, fiber mechanical properties Research, biochip and biological microtissue force measurement, etc., require the measurement of tiny force values in large numbers. Therefore, the research, production and production of micro force sensors are flourishing. However, the performance measurement of the micro force sensor itself appears to be relatively lagging. Therefore, an easy-to-use and traceable ultra-micro force value measuring and testing instrument is developed to provide 10 -5 The basic force value standard below ...