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Test circuit and test method

A technology for testing circuits and testing methods, which can be used in measuring electricity, measuring electrical variables, testing electronic circuits, etc., and can solve problems such as high current consumption

Inactive Publication Date: 2009-01-07
NEC ELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

High-speed signal transmission is achieved by using low-voltage differential signaling (LVDS) technology, which uses current for signal transmission, but the current consumption in LVDS technology has been high

Method used

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  • Test circuit and test method

Examples

Experimental program
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Embodiment Construction

[0018] The test circuit of the present invention will be described in detail below with reference to the accompanying drawings.

[0019] figure 1 It is a circuit diagram showing a circuit configuration of a test circuit in low-voltage differential signaling (LVDS) technology as a high-speed transmitter equivalent to MCMADS. refer to figure 1 , the transmission circuit in LVDS technology includes a transmitter (Tx) 10 and a receiver (Rx) 20 . Furthermore, a transmitter (Tx) 10 and a receiver (Rx) 20 are connected to each other by a transmission channel pair 30 for signals INP and INN. The transport channel pair 30 includes a transport channel INP 31 and a transport channel INN 32 . The transmission channel INP 31 is used for the signal INP, and the transmission channel INN 32 is used for the signal INN. Here, the transmitter (Tx) 10 is provided with switches SW1 11 , SW2 12 , SW3 13 and SW4 14 , a power supply voltage VDD 15 and constant current sources (Io) 16 , 17 , 18 an...

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PUM

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Abstract

In a test circuit, a first N-channel transistor with an open drain is connected to a receiver in a test target integrated circuit and is configured to generate a first amplitude voltage signal in response to a first voltage drive signal. A second N-channel transistor with an open drain is connected to the receiver in the test target integrated circuit and is configured to generate a second amplitude voltage signal in response to a second voltage drive signal complimentary to the first voltage drive signal.

Description

technical field [0001] The present invention relates to a test circuit and a test method, in particular to a test circuit for serial data transmission and a test method for the test circuit. Background technique [0002] Data is transmitted within the computer system by utilizing a communications system including transmit circuitry and receiver circuitry. In recent years, enormous data transmissions have placed demands on high-speed interfaces. High-speed signal transmission is achieved by using low-voltage differential signaling (LVDS) technology, which uses current for signal transmission, but the current consumption in LVDS technology has always been high. Mobile terminals need to reduce power consumption. Therefore, all components, including high-speed transmission circuits, need to reduce power consumption. [0003] In a cellular mobile phone, display data is transferred between internal circuits and the display panel. From a design point of view, the hinge member b...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/31713G01R31/2884G01R31/31715
Inventor 佐伯穣
Owner NEC ELECTRONICS CORP