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IC card service life test stand

A technology of life test and test bench, which is applied in the field of test bench, can solve the problems of unsatisfactory test data and low efficiency, etc., and achieve the effect of rich setting parameters, convenient operation and reliable work

Inactive Publication Date: 2010-10-06
ZHEJIANG MEASUREMENT SCI RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] With the development of electronic technology, IC cards are widely used at present. The insertion and extraction life of IC cards and IC card devices needs to be tested. The efficiency of manual methods is too low, and it cannot meet complex test requirements and provide accurate test data.

Method used

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Examples

Experimental program
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Effect test

Embodiment Construction

[0017] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0018] Such as figure 1 , figure 2 , image 3 , Figure 4 As shown, the present invention includes a test bench 1, a clamping mechanism 2, a plugging system 3, and an automatic control system; wherein:

[0019] The clamping mechanism 2 includes two symmetrical parts on the left and right, installed on the second half of the test bench 1, the position can be adjusted, and the angle of the clamped IC card device can be adjusted at will; the plug-in system 3 is installed in the test bench 1, The front of the clamping mechanism 2, which clamps the IC card and realizes the front and rear insertion and removal actions; the front panel is installed in front of the test bench 1 for installing various man-machine interfaces; the automatic control system includes the man-machine interface and the motion control sub The system consists of two parts, and the m...

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Abstract

The invention discloses a plug-pull life test bed of an IC card, wherein two clamping mechanisms with the same structure are oppositely and coaxially mounted on both sides of a test bed frame, an IC card device can be clamped through regulating the axial positions of the clamping mechanisms, one sides of the two clamping mechanisms with the same structure are provided with plug-pull systems, and the plug-pull systems are vertical between the two clamping mechanisms with the same structure, an IC card mounting plate on the front end of the plug-pull system is equipped with an IC card, and the IC card can forwards and backwards move, which can be inserted or pulled out from a card inserting hole of the IC card device. A man-machine interface can be used to set up parameters, operate, control and look for results. The distance, time, speed, pause time and the like for plugging and pulling the IC card are set through the man-machine interface, and are controlled by a programmable controller to display current times for finishing plugging and pulling in time and alarm to reward users when the stated plug-pull time is reached. The invention has the advantages of reliable work and convenient operation, which can be widely used on various IC cards and the plug-pull life test of an IC card device.

Description

technical field [0001] The invention relates to a test bench, in particular to an IC card insertion and extraction life test bench. Background technique [0002] With the development of electronic technology, IC cards are widely used at present. The insertion and extraction life of IC cards and IC card devices needs to be tested. The efficiency of manual methods is too low, and it cannot meet complex test requirements and provide accurate test data. Contents of the invention [0003] The object of the present invention is to provide an IC card insertion and extraction life test bench, which can be used for the insertion and extraction life test of IC cards and IC card devices. [0004] In order to achieve the above object, the technical scheme adopted in the present invention is: [0005] It includes a test bench, two clamping mechanisms with the same structure and a plug-in system; among them: two clamping mechanisms with the same structure are installed on both sides of...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M19/00G01M99/00
Inventor 程佳金岚陈赏顺沈文新
Owner ZHEJIANG MEASUREMENT SCI RES INST
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