Substrate transfer device, substrate processing apparatus and substrate transfer method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- TOKYO ELECTRON LTD
- Publication Date
- 2010-06-09
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a substrate transfer device, a substrate processing device, and a substrate transfer method. Background technique
[0002] Generally, in the manufacturing process of a semiconductor integrated circuit, various processes such as film formation, etching, and heat treatment are repeatedly performed on a substrate to be processed, such as a semiconductor wafer (hereinafter, also referred to as "wafer"), to form a wafer. form an integrated circuit. In addition, predetermined post-processing may be performed on the wafers subjected to the above-mentioned processing processes. Examples of post-processing include processing for cleaning the wafer (such as processing to remove deposits adhering to the wafer, etc.), and processing for measuring processing results (such as film thickness measurement processing, particle measurement processing, etc.).
[0003] Such wafer processing is performed, for example, by a substrate processing app...