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Multiplex electronic switch and test device having the same

A technology of multi-channel electronic switch and test device, applied in the direction of electronic switch, measuring device, measuring electricity, etc., can solve the problems of single-channel interface 140 damage, cumbersome operation, time-consuming and labor-intensive, etc., to save test time and test operation. The effect of convenience and avoiding physical damage

Inactive Publication Date: 2009-03-04
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, such testing steps are not only cumbersome to operate, time-consuming and labor-intensive, but also frequent plugging and unplugging actions will bring physical damage to the single-channel interface 140 of the testing device 14.

Method used

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  • Multiplex electronic switch and test device having the same
  • Multiplex electronic switch and test device having the same
  • Multiplex electronic switch and test device having the same

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0014] Please also see figure 2 and image 3 , which is a schematic diagram of the structure of the test system 20 in a preferred embodiment and a functional block diagram of the multi-channel electronic switch. Wherein the electronic device 22 to be tested has a multi-channel interface 220, the test device 24 has a single-channel interface 240, and the multi-channel electronic switch 26 is connected to the multi-channel interface 220 of the electronic device 22 through a multi-channel connecting cable 230, and the multi-channel electronic switch 26 passes through The single-channel connection cable 250 is connected to the single-channel interface 240 of the test device 24 , and the multi-channel electronic switch 26 is used to control each channel in the multi-channel interface 220 to communicate with the single-channel interface 240 one by one.

[0015] The multi-channel electronic switch 26 includes: a multi-channel interface 262, a single-channel interface 264, a sound c...

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PUM

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Abstract

The invention relates to a multiway electronic switch which comprises a multi-channel interface, a single channel interface, a sound collecting unit and a control unit; wherein, the sound collecting unit is used for collecting sound signals to carry out the sound-electric transition and generate sound-electric signals; and the control unit is used for communicating each channel in the multi-channel interface with the single channel interface one by one according to the sound-electric signals; the multiway electronic switch is used as the medium for connecting an electronic device to be detected with a test device and controls the channel switching of the multiway electronic switch through the sound to realize the connection of the multi-channel of the electronic device to be tested with the detection device one by one. Compared with the previous channel switching method for replacing the interface, the test operation of the invention is more convenient, and the physical damage which is brought by the insertion and pulling of the interface is avoided. The invention also provides a test device adopting the multiway electronic switch.

Description

technical field [0001] The invention relates to an electronic switch, in particular to a multi-channel electronic switch capable of switching multiple channels and a testing device with the multi-channel electronic switch. Background technique [0002] At present, electronic products will have a variety of interfaces, and many interfaces include multiple channels (or multiple pins, Pin), such as video DAC (Digital Analog Converter, Digital Analog Converter) interface includes red, blue , Green three I / O channels. When manufacturing the electronic product, the manufacturer needs to detect all the channels of this type of interface to ensure the quality of the video output signal of each channel of the interface. [0003] Such as figure 1 As shown, it is a schematic structural diagram of a common test system 10, wherein the electronic device 12 to be tested has a multi-channel interface 120, and the corresponding test device 14 only has a single-channel interface 140. During...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00H03K17/00H03K17/94
CPCH04R29/00G01R31/2825H04S3/00G01R31/2889
Inventor 邓勇军张更亮翁世芳
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
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