Unlock instant, AI-driven research and patent intelligence for your innovation.

Test card and automatic test method thereof

An automatic test system and test card technology, applied in the field of test cards, can solve problems such as reducing the efficiency of automatic testing and prolonging the time of automatic testing.

Inactive Publication Date: 2010-10-13
WISTRON CORP +1
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, if the above test method is carried out, it is necessary to perform at least two plugging and unplugging actions to adjust whether the SD memory card is in a locked or unlocked state.
In this way, it will take more than 20 seconds, which will greatly prolong the time of automatic testing and reduce the efficiency of automatic testing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test card and automatic test method thereof
  • Test card and automatic test method thereof
  • Test card and automatic test method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] In order to make the above and other objects, features and advantages of the present invention more comprehensible, specific embodiments of the present invention are listed below and described in detail in conjunction with the accompanying drawings.

[0021] Please also refer to Figure 1 to Figure 3 The circuit diagram about the connection of the test card and the automatic test system with multiple signal pins in the socket. in figure 1 It is a schematic diagram of the test card of the present invention; figure 2 It is a schematic diagram of the connection between the test card and the slot of the present invention; and image 3 It is a circuit diagram of the automatic test system of the present invention connected to multiple signal pins in the slot.

[0022] The automatic test system 10 of the present invention includes a test card 11 and a test fixture 12 . The automatic test system 10 is used to automatically test whether the function of the socket 91 of the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a testing card and an automatic testing method thereof for an automatic testing system. The invention is used for testing a slot of an electronic device. The testing card comprises a testing circuit and a metal sheet. The automatic testing method includes: a testing signal is input to a write protection pin in the slot; whether the testing circuit is connected with the written protection pin by the metal sheet and forms a loop is judged; the resistance of the loop is measured; and whether the measured resistance is close to a fixed value is judged.

Description

technical field [0001] The invention relates to a test card, in particular to a test card used for testing the writing protection pin of a slot. Background technique [0002] With the advancement of technology, the demand for the production and use of electronic devices is increasing day by day. Therefore, automatic test systems capable of testing the functions of electronic devices have also been widely used in production lines. Some electronic devices are now equipped with slots that can read other derived devices, such as slots that can read SD memory cards. Therefore, while the automatic test system automatically tests the function of the electronic device, it must also test the function of the socket. [0003] Taking the SD memory card slot as an example, in addition to the pins that can transmit data, the internal signal pins also include a write protection that can determine whether the SD memory card is locked or unlocked (Lock / Unlock). pins. Since the write prot...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R27/02
Inventor 孙宜阳严小兵
Owner WISTRON CORP