Supercharge Your Innovation With Domain-Expert AI Agents!

Method for testing embedded wireless transceiver with minimal interaction between wireless transceiver and host processor during testing

A wireless transceiver and main processor technology, applied in wireless communication, transmission monitoring, electrical components, etc., can solve problems such as limited functions

Active Publication Date: 2009-06-10
LITEPOINT CORP
View PDF1 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

therefore, although there is interest in producing a fully functional wireless transceiver capability, manufacturers are still not interested in expending significant resources to integrate wireless functionality given its limited role in the overall operation of the system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for testing embedded wireless transceiver with minimal interaction between wireless transceiver and host processor during testing
  • Method for testing embedded wireless transceiver with minimal interaction between wireless transceiver and host processor during testing
  • Method for testing embedded wireless transceiver with minimal interaction between wireless transceiver and host processor during testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] Exemplary embodiments of the presently claimed invention will now be described in detail with reference to the accompanying drawings. Such descriptions are illustrative only and do not limit the scope of the invention. These embodiments are described in sufficient detail to enable those skilled in the art to practice the invention, it being understood that other embodiments may be practiced with some changes without departing from the spirit or scope of the invention.

[0022] Throughout the disclosure, unless otherwise clearly indicated to the contrary from the context, it should be understood that reference to a single circuit unit may obviously be singular or plural. For example, the term "circuitry" may include a single component or multiple components that are either active and / or passive and connected or otherwise coupled together (e.g., as one or more integrated circuit chip) to provide the described functions. Additionally, the term "signal" may refer to one o...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for testing a wireless transceiver embedded within a wireless data communication system that also includes a host processor with minimal interaction between the wireless transceiver and the host processor during such testing. The wireless signal interface between the wireless data communication system and external test equipment is used to convey test initiation or data signals from the external test equipment to the wireless data communication system, and responsive data or acknowledgement signals from the wireless data communication system to the external test equipment.

Description

technical field [0001] This invention relates to wireless data communication systems having a host processor and wireless transceiver embedded therein, and more particularly to production testing of such systems. Background technique [0002] As the number and applications of wireless data communication systems increase, it becomes increasingly important for manufacturers of such systems to perform production testing of wireless transceivers embedded in such systems in a more time-efficient manner. It is well known that one problem with production testing of such embedded transceivers is that there is usually no direct, eg wired, digital control connection between the device under test (DUT) and the test controller (eg personal computer). Instead, communication must occur through the main processor, which is also embedded in the system. As a result, production testing becomes more complicated because the test firmware must be installed or saved to run on the embedded host p...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/00H04B1/40
CPCH04B17/0092H04B17/0045H04B17/327H04B17/3911H04B17/00H04W24/06
Inventor C·V·奥尔加德B·马德森
Owner LITEPOINT CORP
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com