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Multi-test sample CT scanning method

A CT scan and sample technology, applied in the field of image processing, can solve the problems of long CT scan time, low X-ray energy utilization rate, waste, etc., and achieve the effect of saving CT scan time

Inactive Publication Date: 2011-08-31
SHANGHAI JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Applying existing technology in experiments with a large number of test samples, there are problems such as long CT scanning time and low utilization rate of X-ray energy
Especially when the light source uses a synchrotron radiation source, X-rays are still very bright when passing through a sample, and it is a waste if not fully utilized

Method used

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Embodiment Construction

[0023] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. This embodiment is carried out on the premise of the technical solution of the present invention, and the detailed implementation and specific operation process are given, but the protection scope of the present invention is not limited to the following embodiments.

[0024] Take CT scanning of 19 test samples at the same time as an example. The realization process of whole invention is as follows:

[0025] 1. Fix each isolated tissue with a test bracket, and the plane of the sample to be scanned is horizontal, so that it meets the spatial position relationship required for CT scanning.

[0026] 2. If Figure 1-3 As shown in the figure, 1. the fixed bracket with the experimental sample, 2. the X-ray source, 3. the detector, and 4. the test bench. Place the fixed brackets 1 with the test samples on the test platform 4 so that the planes to be scanned o...

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Abstract

The invention relates to a multi test-sample CT scanning method in a biomedicine imaging technical field, comprising the following steps: respectively fixing the test-sample on a fixation device; mounting the fixation device of the test-sample on a testing platform, performing CT scanning to obtain the projection data, reconstructing the fault image using a reconstruction algorithm and then performing the post-treatment of the reconstructed image. The multi test-sample CT scanning method can evidently save the CT scanning time, increase the X-ray energy usage ratio and make the multi test-sample to be measured in the same illumination condition and the testing result has more correlatability.

Description

technical field [0001] The present invention relates to a method in the technical field of image processing, in particular to a multi-test sample CT scanning method. Background technique [0002] The CT scanning process is like this: the X-ray source emits X-rays at one point, and after passing through the object to be imaged, the attenuated X-rays are received by the detector on the opposite side, and the X-rays are converted into electrical signals and sent to the modulus of the computer Converter and data collector, convert to digital signal and store in computer. This is just one exposure and acquisition process. In order to obtain the projection data needed to reconstruct the object, the X-ray source and the corresponding detector need to move along a certain trajectory, and complete an exposure and data acquisition process at each position. [0003] Through the retrieval of prior art, it is found that there is only CT scan imaging for single test sample, such as M.J.P...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04
Inventor 赵俊俞培春奚岩
Owner SHANGHAI JIAOTONG UNIV