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Method for testing an electronic unit

A technology for electronic units and electronic devices, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., which can solve the problems of rapid aging of devices, reduction of available space on circuit boards, and complex costs.

Active Publication Date: 2010-01-20
EHNDRESS KHAUZER GMBKH KO KG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage of these test points is that, on the one hand, they reduce the available space on the board; on the other hand, reading out such a large number of test signals is complicated and thus expensive
Another problem in the case of a large number of devices is that the devices age rapidly or sometimes stop working due to extreme operating and process conditions such as temperature jumps or very extreme temperatures

Method used

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  • Method for testing an electronic unit
  • Method for testing an electronic unit

Examples

Experimental program
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Embodiment Construction

[0021] figure 1 A capacitive measuring instrument is shown schematically. Here, the sensor element 1 is a rod, to which the electronics unit 2 applies an alternating voltage as an excitation signal. The sensor element 1 and the second probe (not shown) or the wall of the container (not shown) form a capacitor, for example the medium whose level is to be measured acts as a dielectric, the capacitance of the capacitor being a measure of the level of the medium.

[0022] In the electronics unit 2 are a plurality of devices whose performance (eg in the case of manufacture) or the change in performance over time is to be tested. According to the invention, the devices are combined into individual groups 5 . Group 5 here refers to components that are located adjacent to one another, or that are remote from one another, for example mounted on a card or a circuit board, which are suitably electrically connected to one another for the group formation and for the test phase. Here, gr...

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PUM

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Abstract

The invention relates to a method for testing an electronic unit (2), particularly an electronic unit (2) of a device for determining and / or monitoring a process variable, wherein the electronic unit (2) comprises a plurality of electric components. According to the invention, at least some of the electric components are combined in a group (5), to the group (5) a query signal is transmitted, theresponse signal from the group (5) is received, and the response signal is evaluated. Furthermore, the invention relates to a device for determining and / or monitoring a process variable.

Description

technical field [0001] The invention relates to a method for testing an electronic unit, in particular an electronic unit of a device for determining and / or monitoring a process variable, the electronic unit having a plurality of electronic components. Furthermore, the invention relates to a device for determining and / or monitoring a process variable, comprising at least one sensor element and at least one electronics unit, wherein the electronics unit comprises a plurality of electronics components. Background technique [0002] In process automation technology, measuring instruments are frequently used, which are used to detect or monitor various measured or process variables. Measuring instruments generally comprise: a sensor element, which generates a measurement signal dependent on a process variable or a change in the process variable; and an electronics unit. In the following, an "electronic unit" of a measuring instrument or correspondingly a device for determining ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/02
CPCG01R31/2829
Inventor 迪特马尔·弗吕奥夫乌多·格里特克阿克塞尔·洪佩特哈拉尔德·朔伊布勒
Owner EHNDRESS KHAUZER GMBKH KO KG