Method and device for testing anti-static device with near failure prompting function
A test method and anti-static technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve problems such as frequent errors, difficult control, damage, etc., and achieve the effect of preventing errors and preventing sudden failure
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[0022] The above and other technical features and advantages of the present invention will be described in more detail below in conjunction with the accompanying drawings.
[0023] An automatic test method for an anti-static device with a function of prompting near failure. The method includes steps (please refer to figure 1 ):
[0024] 1. Insert a test device at both ends of the test signal line, and connect the object under test to form a loop.
[0025] 2. Press the start button to measure the voltage of the test object.
[0026] 3. Calculate the measured voltage and the reference voltage to obtain the actual voltage.
[0027] 4. According to the actual voltage obtained, the resistance value of the test object is obtained through calculation.
[0028] 5. Compare the resistance value with the upper and lower limits of the resistance of the tested object, where the upper and lower limits can be based on international standards, such as ANSI / ESD S20.20.
[0029] 6. If the resistance value ...
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