Method and device for detecting cloud pattern defects of liquid crystal display panel

A technology of a liquid crystal display panel and a detection method, which is applied in image data processing, optics, instruments, etc., can solve problems such as low efficiency and accuracy of moiré defect detection

Inactive Publication Date: 2010-02-24
BOE TECH GRP CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to solve the shortcomings of low moiré defect detection efficiency and detection

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  • Method and device for detecting cloud pattern defects of liquid crystal display panel
  • Method and device for detecting cloud pattern defects of liquid crystal display panel
  • Method and device for detecting cloud pattern defects of liquid crystal display panel

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Embodiment Construction

[0047] In the detection of moiré defects, the thin-film transistor liquid crystal display panel is usually set to display a fixed gray scale image. According to the existing product standards, the brightness uniformity of the liquid crystal display panel is above 75%, and the gray value can be It is considered to be a continuous change, and the gray value of the moiré defect area will have a large abnormal change; in the present invention, the actual sample image is first collected, and then the B-spline least square method is used to fit the liquid crystal display to be detected. The background image of the panel, the background image is the background estimation without moiré defect, and it is compared with the collected sample image to obtain the moiré defect image.

[0048] figure 1 It is a flowchart of an embodiment of a method for detecting moiré defects in a liquid crystal display panel of the present invention, as figure 1 As shown, the detection method includes the f...

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Abstract

The invention provides a method and a device for detecting cloud pattern defects of a liquid crystal display panel, wherein the method comprises the following steps: 1, acquiring sample images of theliquid crystal display panel to be detected; 2, according to the sample images, fitting out background images corresponding to the sample images by using a B spline least square method; and 3, comparing the sample images with the background images so as to obtain images of the cloud pattern defects. The device for detecting the cloud pattern defects of the liquid crystal display panel comprises asample image acquisition module, a background image fitting module and a defect image acquisition module. The method and the device for detecting the cloud pattern defects of the liquid crystal display panel can improve the efficiency and the accuracy of detecting the cloud pattern defects of the liquid crystal display panel, and can acquire ideal images of the cloud pattern defects.

Description

technical field [0001] The invention relates to the technical field of liquid crystal displays, in particular to a detection method and detection device for moiré defects of a liquid crystal display panel. Background technique [0002] At present, in order to improve the competitiveness of their own products, the major Thin Film Transistor Liquid Crystal Display (hereinafter referred to as TFT-LCD) manufacturers are all striving to improve product quality and reduce costs, and the most effective and direct way to reduce costs is The best way is to improve the good rate of products, which requires researchers to accurately and quickly judge and analyze the causes and types of various defects, and continuously improve the process technology. Among the various defects of thin film transistor liquid crystal display panels, moiré defects account for a relatively large proportion. They are mostly characterized by low contrast, areas larger than one pixel, blurred boundaries, and d...

Claims

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Application Information

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IPC IPC(8): G02F1/13G06T7/00G06T7/136G06T7/155G06T7/194
Inventor 唐剑王大巍李新国梁珂董友梅
Owner BOE TECH GRP CO LTD
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