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Device for cleaning contaminants on surface of spherical Langmuir probe

A technology of Langmuir probe and cleaning ball, which is applied in measurement devices, cleaning methods and utensils, material analysis by electromagnetic means, etc., to achieve the effect of reducing heating power consumption

Inactive Publication Date: 2010-05-05
NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to overcome the deficiencies of the prior art, in order to solve the problem of effectively cleaning the Langmuir probe when the satellite ion electric propulsion plume is monitored during the satellite’s in-orbit operation, a cleaning spherical Langmuir probe is proposed. device for probe surface contamination

Method used

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  • Device for cleaning contaminants on surface of spherical Langmuir probe

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Embodiment Construction

[0025] The present invention will be further described below in conjunction with the accompanying drawings.

[0026] A device for cleaning pollutants on the surface of a Langmuir probe, the structure of which is as follows figure 1 As shown, including: cleaning halogen lamp 1, ceramic halogen lamp bracket 2, cleaning halogen lamp power supply coaxial wire 3, ceramic insulating base 4, spherical Langmuir probe hollow column bracket 5, temperature measuring resistance power supply coaxial wire 6. Temperature measuring resistor 7. Cleaning halogen lamp power supply 9. Temperature measuring power supply 10.

[0027] The power requirement for cleaning the halogen lamp 1 is "12V, 9W", which is used to heat the hollow spherical Langmuir probe 8 .

[0028] The ceramic halogen lamp bracket 2 is a hollow cylinder structure or a hollow cone structure, and is used for fixing and supporting the cleaning halogen lamp 1 .

[0029] The temperature measuring resistor 7 adopts a surface-mount...

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Abstract

The invention discloses a device for cleaning the contaminants on the surface of a spherical Langmuir probe, comprising a hollow spherical Langmuir probe, a cleaning halogen lamp, a ceramic halogen lamp bracket, a coaxial lead for the power supply of the cleaning halogen lamp, a temperature measuring resistor, a coaxial lead for supplying power to the temperature measuring resistor, a hollow columnar spherical Langmuir probe bracket, a ceramic insulating base, a temperature measuring power supply interface and a cleaning halogen lamp power supply interface. One end of coaxial lead for the power supply of the cleaning halogen lamp penetrates through hollow columnar spherical Langmuir probe bracket and the ceramic halogen lamp bracket and is connected with the cleaning halogen lamp, and the other end is connected with the power supply of the cleaning halogen lamp; the temperature measuring resistor is adhered to the surface of the hollow cavity of the spherical Langmuir probe; one end of the coaxial lead for supplying power to the temperature measuring resistor penetrates through hollow columnar spherical Langmuir probe bracket and is connected with the temperature measuring resistor, and the other end is connected with a temperature measuring power supply. The device can be used for effectively clean the spherical Langmuir probe when the satellite runs in the orbit during the satellite ion electric propulsion plume monitoring, and the device can be heated by consuming lower power.

Description

technical field [0001] The invention belongs to the technical field of satellite ion electric propulsion plume monitoring, and relates to a device for cleaning pollutants on the surface of a spherical Langmuir probe, which is used for cleaning pollutants on the surface of the Langmuir probe in the measurement of plasma parameters in a space charged environment. cleaning. Background technique [0002] The Langmuir probe is used for the measurement of low-temperature non-equilibrium plasma. By directly inserting a probe with a certain potential in the plasma, the density and temperature of electrons and ions in the plasma can be obtained according to the current change caused by the conflict between electrons and ions. And other parameters, has become an indispensable technology in today's plasma research. Spherical Langmuir probes with a hollow structure are widely used in satellite ion electric propulsion plume monitoring due to their large effective charge collection area,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/00B08B7/00
Inventor 田恺秦晓刚薛玉雄杨生胜马亚莉曹洲王鷁
Owner NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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