Test method of intrinsic error of zero level indicating value

Abstract

The invention discloses a test method of an intrinsic error of a zero level indicating value, which is characterized by comprising the following steps of: before starting a machine, connecting a standard test instrument (1) with a corresponding test end hole of a calibrated electrical level type tester (3) by using a test wiring harness (2); then starting the machine, operating the standard test instrument and the calibrated electrical level type tester (3) in an assembling mode according to functions, measuring data of 6 error measuring points including a working frequency lowest end, a highest end and a reference frequency and the like, wherein each frequency point is measured for 3 times and recorded; and then computing with all the acquired 18 primary data to obtain a test result of the intrinsic error of the zero level indicating value. By using single multifunctional standard tester, the invention simplifies test system and test connecting line operation, reduces test procedures, and shortens the whole test time to be about one third of that of the traditional test method.

Description

technical field [0001] The invention relates to a test method for the basic error of level test instrument calibration. Background technique [0002] In the calibration test of level test instruments, the basic error test of zero-level indication is a necessary test item. The existing problems in the basic error test method of zero-level indication are: [0003] The structure of the test system is complex due to the use of multiple standard test instruments with a single function; [0004] Under the same impedance condition, it must be shut down several times to change the connection line of the test system, and there are many procedures; [0005] The number of error measurement points is more than 10, and the specific number cannot be determined before the test. The redundant measurement points will increase the workload and have little effect on the test results; [0006] The number of measurements for each frequency point is more than 5, and the specific number cannot b...

AI Technical Summary

Problems solved by technology

[0008] The technical problem to be solved by the present invention is to provide a basic error test method for zero-level indication to solve the complex structure of the test system existing in the prior art, and under the same impedance condition, it must be shut down several times to change the connection of the test system Too many lines and processes

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