Test method of intrinsic error of zero level indicating value

A basic error and test method technology, applied in the direction of measuring electrical variables, measuring devices, instruments, etc., can solve problems such as connecting lines and many processes

Inactive Publication Date: 2010-05-05
ELECTRIC POWER SCI RES INST OF GUIZHOU POWER GRID CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] The technical problem to be solved by the present invention is to provide a basic error test method for zero-level indication to solve the complex structure of the test sys

Method used

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  • Test method of intrinsic error of zero level indicating value
  • Test method of intrinsic error of zero level indicating value

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Experimental program
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Embodiment Construction

[0018] Embodiments of the present invention: the present invention includes the following process: before starting the machine, connect the standard test instrument 1 with the calibrated level class tester 3 with the test harness 2 corresponding to the required calibration impedance of the calibrated level class tester 3 Connect the corresponding test port holes, then turn on the power, operate the standard test instrument 1 and the calibrated level test instrument 3 according to the function combination, and measure the data of 6 error measurement points including the lowest end, the highest end and the reference frequency of the working frequency. Each frequency point is measured 3 times and recorded, and then all 18 original data obtained are used for calculation to obtain the basic error test results of the zero-level indication.

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Abstract

The invention discloses a test method of an intrinsic error of a zero level indicating value, which is characterized by comprising the following steps of: before starting a machine, connecting a standard test instrument (1) with a corresponding test end hole of a calibrated electrical level type tester (3) by using a test wiring harness (2); then starting the machine, operating the standard test instrument and the calibrated electrical level type tester (3) in an assembling mode according to functions, measuring data of 6 error measuring points including a working frequency lowest end, a highest end and a reference frequency and the like, wherein each frequency point is measured for 3 times and recorded; and then computing with all the acquired 18 primary data to obtain a test result of the intrinsic error of the zero level indicating value. By using single multifunctional standard tester, the invention simplifies test system and test connecting line operation, reduces test procedures, and shortens the whole test time to be about one third of that of the traditional test method.

Description

technical field [0001] The invention relates to a test method for the basic error of level test instrument calibration. Background technique [0002] In the calibration test of level test instruments, the basic error test of zero-level indication is a necessary test item. The existing problems in the basic error test method of zero-level indication are: [0003] The structure of the test system is complex due to the use of multiple standard test instruments with a single function; [0004] Under the same impedance condition, it must be shut down several times to change the connection line of the test system, and there are many procedures; [0005] The number of error measurement points is more than 10, and the specific number cannot be determined before the test. The redundant measurement points will increase the workload and have little effect on the test results; [0006] The number of measurements for each frequency point is more than 5, and the specific number cannot b...

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Application Information

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IPC IPC(8): G01R35/00
Inventor 何军
Owner ELECTRIC POWER SCI RES INST OF GUIZHOU POWER GRID CO LTD
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