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Method for calibrating measurement value applied to singlechip without multiply instruction

A calibration method and technology of multiplication instructions, applied in instruments and other directions, can solve the problems of inability to handle floating-point multiplication and division operations, limited processing capacity, and low calibration efficiency, so as to avoid floating-point multiplication and division operations and improve processing power.

Inactive Publication Date: 2011-05-25
ZHEJIANG UNIV OF TECH
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Problems solved by technology

[0026] In order to overcome the limitations of the existing method for calibrating measured values ​​of single-chip microcomputers without multiplication instructions, the processing capability is limited, the multiplication and division of floating-point numbers cannot be processed, and the calibration efficiency is low. Using floating-point multiplication and division operations, an efficient and convenient measurement value calibration method applied to single-chip microcomputers without multiplication instructions

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  • Method for calibrating measurement value applied to singlechip without multiply instruction
  • Method for calibrating measurement value applied to singlechip without multiply instruction
  • Method for calibrating measurement value applied to singlechip without multiply instruction

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Embodiment Construction

[0059] The present invention will be further described below.

[0060] A method for calibrating measured values ​​applied to single-chip microcomputers without multiplication instructions, comprising the following steps:

[0061] (1), using nonlinear segmentation to segment the area where the measured value is located;

[0062] (2) Calibrate the measured value in the linear region after each segment, that is, accumulate multiple A / D sampling values ​​and shift to the right n times, refer to the following formula to calculate the measured value of the calibrated parameter:

[0063] Y = Σ i = 1 S X 2 n + b

[0064] in:

[0065] Y: parameter measurement value;

[0066] X: A / D sampling value;

[0067] S: Calibration coefficient, that is, the number o...

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Abstract

The invention discloses a method for calibrating a measurement value applied to a singlechip without a multiply instruction, which comprises the following steps: (1) segmenting an area where the measurement value is positioned by adopting a nonlinear segmenting mode; and (2) calibrating the measurement value at each segmented linear area, namely accumulating multiple A / D sampling values and then shifting the sum to right for n times, acquiring the calibrated parameter measurement value through calculation, storing a calibration coefficient S by using two bytes, defining the high byte as SH, and defining the low byte as SL, wherein S = SH*256 + SL; and (3) accurately calibrating the parameter measurement value by adjusting the calibration coefficient S according to the standard measurement value of a standard instrument. The method improves the processing capability of the singlechip without the multiply instruction, avoids a floating-point number multiplication-division method for operation, and is efficient and convenient.

Description

technical field [0001] The invention relates to a method for calibrating measured values ​​of a single-chip microcomputer. Background technique [0002] In the detection system, the measured physical quantity is converted into an electrical signal by the sensor, and the signal is passed through the amplifier and then converted by the A / D to obtain the corresponding digital quantity. After the measured physical quantity is converted into a digital quantity, it needs to be converted into an engineering quantity familiar to the operator. Because the digital value obtained after A / D conversion is not equal to the dimension of the original physical quantity, but only represents the magnitude of the value. The A / D sampling value must be converted into a numerical value with dimensions before it can be calculated and displayed. [0003] Any signal conversion deviation in any link of the entire measurement channel will cause errors in the final measurement results. Therefore, it ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D18/00
Inventor 单晓杭孙建辉张利丁力
Owner ZHEJIANG UNIV OF TECH