Device and method for testing hot plugging of interface

A technology of a test device and a test method, applied in the field of interface circuits, can solve problems such as inaccurate test results, and achieve the effects of high test efficiency, accurate test results and low test costs

Inactive Publication Date: 2010-06-16
BEIJING XINWANG RUIJIE NETWORK TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0022] The present invention aims to provide a test device and method for interface hot plugging, which can solve the problem of inaccurate test results existing in the prior art

Method used

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  • Device and method for testing hot plugging of interface
  • Device and method for testing hot plugging of interface
  • Device and method for testing hot plugging of interface

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Embodiment Construction

[0034] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments.

[0035] Before describing the testing method and testing device of the present invention, the principle of the interface hot-plug testing method according to the embodiment of the present invention is analyzed by taking the serial port as an example and referring to the accompanying drawings.

[0036] The reason why the serial port is hot-swapped is that energy is generated when the serial port is hot-swapped. The greater the energy, the easier it is to damage the device. When the energy is greater than the limit that the serial port circuit can bear, the serial port will be damaged.

[0037] The energy of serial port hot-swapping comes from the interconnection of two devices through the serial port, and the hot-swapping energy is generated due to the unbalanced ground potential of the two devices.

[0038] The main reason for the un...

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PUM

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Abstract

The invention provides a device and a method for testing hot plugging of an interface. A test device comprises a first capacitor, a second capacitor and a testing wire, wherein the first and second capacitors are connected in series between a live wire and a naught wire; and one end of the testing wire is connected between the first capacitor and the second capacitor, while the other end is connected with a pin of the interface to be tested. The test device with the structure can perform a hot plugging test of a signal wire of the interface to be tested under the maximum hot plugging energy and achieves a correct test result, high test efficiency and low test cost, so the problems of high randomness in the test result and incorrect test result existing in the prior art are solved.

Description

technical field [0001] The invention relates to the field of interface circuits of input / output devices, in particular to a test device and method for interface hot plugging. Background technique [0002] Hot plugging usually refers to the action of inserting or unplugging some parts of the device without turning off the power. [0003] For example, in practical applications, the user needs to configure a device through a PC. At present, the PC and the serial port of the device are generally connected through a serial cable, and the device is configured through the serial port of the PC. Plug and unplug the serial port cable when the power is on. [0004] Consequences caused by serial port hot plugging: the serial port is damaged. Usually, the serial port of the computer is not allowed to be hot-swappable, but it is difficult for users to perform hot-swapping of the serial port during use. Therefore, some protection measures will be added to the serial ports of communicat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/267
Inventor 叶良华
Owner BEIJING XINWANG RUIJIE NETWORK TECH CO LTD
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