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Method for automatically correcting laser induced plasma emission spectrum continuous background interference

A plasma and laser-induced technology, applied in the field of material composition analysis, can solve problems such as narrow adaptability and complex operation, and achieve the effects of improved performance, fast correction, and fast calculation speed

Active Publication Date: 2012-04-11
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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Problems solved by technology

[0007] In order to overcome the deficiencies in the prior art that require manual participation, complex operation, and narrow application range, the purpose of the present invention is to provide a method for automatically correcting the continuous background interference of laser-induced plasma emission spectrum, which has accurate and rapid detection and correction, and is easy to operate Features

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  • Method for automatically correcting laser induced plasma emission spectrum continuous background interference
  • Method for automatically correcting laser induced plasma emission spectrum continuous background interference
  • Method for automatically correcting laser induced plasma emission spectrum continuous background interference

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Embodiment

[0035] like figure 1 , 2 As shown, the method for automatically correcting the continuous background interference in the laser-induced plasma emission spectrum of the present invention, through the computer control program, performs the following steps:

[0036] Step 1) collect the spectrum emitted by the plasma with continuous background interference, and find all the minimum values ​​on the spectrum; specifically collect spectral data through program initialization, and the spectral data includes n data points (I(i), λ( i)), n is determined by the detector type. In this embodiment, a CCD detector with 7×2048 pixels is used, and the spectral wavelength range is 200nm-980nm, so the value of n is 14336; all the minimum points are searched in the n spectral data.

[0037] The minimum value points are sorted according to the wavelength from small to large, and the serial numbers are j=1, 2, ..., m, m is the total number of minimum value points, and the minimum value points cont...

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Abstract

The invention discloses a method for automatically correcting laser induced plasma emission spectrum continuous background interference. By using a computer control program, the method comprises the following steps of: 1) collecting a spectrum which is emitted by the plasma and has continuous background interference, and seeking all the minimum values on the spectrum, 2) calculating a threshold value of the minimum value, 3) comparing the rate of change of adjacent minimum values with the threshold value, and deducting the minimum value out of the minimum threshold value scope; 4) fitting thededucted residue minimum value by using a piecewise polynomial function so as to acquire a fitting function as an estimating function of the spectrum continuous background used for estimating the background, and 5) subtracting an estimated background value from the spectral intensity having continuous background interference so as to acquire the corrected laser induced plasma emission spectrum. Without manual operation, the method of the invention can realize once automatic correction for spectrum background in a whole spectral region, can correct accurately and rapidly, is applied to both simple spectrum and complex spectrum, and promotes the property of analyzing sample component.

Description

technical field [0001] The invention relates to the technical field of material composition analysis, in particular to a method for automatically correcting continuous background interference of laser-induced plasma emission spectrum. Background technique [0002] Laser-induced plasma emission spectroscopy, also known as laser-induced breakdown spectroscopy (LIBS), is an atomic emission spectroscopy analysis technique that has a wide range of applications in material composition analysis. In LIBS, the pulsed laser is converged by a converging lens to generate more than 100 MW / cm 2 The power density of a small part of the measured substance is melted and evaporated, and a plasma with high temperature and high electron density is generated. The composition of the measured substance can be determined by analyzing the emission spectrum of the plasma. [0003] In the early stages of laser-induced plasmas, the intense background radiation drowns out the discrete spectral lines t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/62
Inventor 于海斌孙兰香杨志家郭前进辛勇丛智博
Owner SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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