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Test configuration method, equipment and system of business chip

A business chip and test configuration technology, applied in the field of communication, can solve problems such as long business chip 1 cycle, poor software and hardware versatility, and high requirements for engineers, and achieve the effect of rich problem positioning methods, fast operation speed, and strong functions

Inactive Publication Date: 2010-06-30
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, it is necessary to develop the software and hardware (for example: single-board software, driver software, write BSP (Board Support Package, board-level support package) program, etc.) of special embedded CPU system 2 for the service chip 1 under test, and complex control The software runs in the embedded CPU system 2, which leads to difficult debugging, high requirements for engineers, and poor versatility of the developed software and hardware; and problems in the embedded CPU system 2 during the test will affect the test of the service chip 1 under test. As a result, the business chip 1 has a long cycle from design to production, high cost, and low test efficiency.

Method used

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  • Test configuration method, equipment and system of business chip
  • Test configuration method, equipment and system of business chip
  • Test configuration method, equipment and system of business chip

Examples

Experimental program
Comparison scheme
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Embodiment 1

[0027] This embodiment firstly provides a system for testing service chips, such as figure 2 As shown, it includes: a PC 3, a test instrument 5 and a service chip 1 under test; the PC 3 is used to map the register and entry data of the service chip 1 under test to the memory, and use the The register and entry data of the configuration of the service chip 1 is performed to facilitate the test of the service chip 1 .

[0028] Among them, the test instrument 5 establishes a connection with the service chip 1 under test, and checks whether the service chip 1 under test meets the requirements by sending and receiving various test data. The test instrument 5 can be separated from the PC 3 and work independently, or can establish a connection with the PC 3, send and receive various test data according to the schedule of the PC 3, and feed back the test results to the display interface of the PC 3.

[0029] Among them, the service chip 1 under test is placed on the single board, be...

Embodiment 2

[0043] This embodiment provides a method for testing a service chip, such as image 3 shown, including:

[0044] S301. Establish a channel between the service chip under test and the PC through the bus converter, and develop or install the driver program and test program required for testing under the PC environment.

[0045] When the bus of the service chip is a parallel bus, a path between the service chip and the PC is established through a bus converter. One end of the bus converter is connected to the parallel bus of the business chip, and the other end is connected to the serial bus of the PC, and the data transmitted by the parallel bus is transparently transmitted to the serial bus, and / or the data transmitted by the serial bus is Transparently transmitted to the parallel bus. The parallel bus can be a LocalBus bus, a PCI bus, etc., and the serial bus can be a PCIE bus.

[0046] S302. Map the register and table item data of the service chip to the memory of the PC o...

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Abstract

The embodiment of the invention discloses a test configuration method, equipment and a system of a business chip, which relate to the technical field of communication. The invention aims at improving the chip test efficiency and reducing the cost. The method comprises the following steps: mapping register and list item data of the business chip to a memory of a configuration device through a bus converter; and utilizing the register and list item data in the memory to execute the configuration on the business chip by the configuration device according to the stored test program for bringing convenience to the test on the business chip. The system comprises the configuration device, a test single board, a test instrument and a bus converter, wherein the configuration device is used for mapping the register and list item data of the business chip to the memory and utilizing the register and list item data in the memory to execute the configuration on the business chip according to the test program on the configuration device, and the test instrument sends and receives the test data and extracts and records the test results of the business chip after the configuration completion on the business chip by the configuration device.

Description

technical field [0001] The invention relates to the field of communication technology, in particular to a method, device and system for testing and configuring service chips. Background technique [0002] ASIC (Application Specific Integrated Circuit, Application Specific Integrated Circuit) service chips are widely used in communication equipment to meet high-speed and large-capacity service requirements. [0003] In an architecture in which control and service processing are separated, the test single board is composed of a service chip and an embedded CPU (Central Processing Unit, central processing unit) system. The embedded CPU system is used to configure various complex services in the service chip. Among them, before the service chip enters the market, it is necessary to test the function and performance of the service chip. The existing chip testing scheme is to develop a single test board, such as figure 1 As shown, the test board includes a service chip 1 to be ...

Claims

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Application Information

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IPC IPC(8): H04L12/26
Inventor 崔建荣杨勇方陆军李猛
Owner HUAWEI TECH CO LTD