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Picking and placing device of test sorting machine

A technology for testing sorting machines and pick-and-place devices, which is applied in the direction of measuring devices, single semiconductor device testing, semiconductor/solid-state device testing/measurement, etc. It can solve problems such as complex composition, simplify composition, reduce manufacturing costs, and increase speed Effect

Active Publication Date: 2010-07-07
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, in order to adjust the distance between the Y-axis, it is necessary to install an additional air cylinder device in addition to a pair of air cylinder devices, so the configuration becomes very complicated.

Method used

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  • Picking and placing device of test sorting machine
  • Picking and placing device of test sorting machine
  • Picking and placing device of test sorting machine

Examples

Experimental program
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Embodiment Construction

[0064] Hereinafter, preferred embodiments according to the present invention will be described in detail with reference to the accompanying drawings, and repeated content or obvious matters will be omitted or briefly described. (Note: For the "row direction" and "column direction" mentioned in this article, please refer to image 3 , 4 , 8, 11, 12, 15, 16, 19, 22, 23, that is, "row direction" is the arrangement direction of rows, and "column direction" is the arrangement direction of columns)

[0065] image 3 is a perspective view of a pick-and-place device according to a first embodiment of the present invention, Figure 4 is an exploded perspective view showing the main configuration of the pick-and-place device according to the first embodiment of the present invention.

[0066] refer to image 3 and Figure 4 , The pick-and-place device 300 according to the embodiment of the present invention includes a housing 310 , a picker 320 , a row spacing adjusting device 330 ...

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PUM

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Abstract

The present invention discloses a picking and placing device of a test sorting machine. The picking and placing device comprises a pick-up device that is arranged in a state of multiplying N rows by M columns, wherein, the N and M are respectively natural numbers that is bigger than or equal to 2, a line spacing adjusting device for leading the moving of the pick-up device in the column direction and adjusting the row spacing of the pick-up device, a column spacing adjusting device for leading the moving of the pick-up device in the row direction and adjusting the column spacing of the pick-up device. The present invention has advantages of simplifying the structure of a picking and placing device, reducing the cost of manufacture and improving the speed of transferring a semiconductor component from a user tray to a test tray.

Description

technical field [0001] The invention relates to a test sorter, in particular to a pick-and-place device for the test sorter. Background technique [0002] The test handler (Test Handler) is a supporting device that provides semiconductor components manufactured according to a predetermined manufacturing process, so that the tester (Tester) can test the semiconductor components. The test sorter loads the semiconductor components on the customer tray to the test tray, supplies the semiconductor components on the test tray to the tester, and unloads the tested semiconductor components from the test tray to the user tray. [0003] Such as figure 1 As shown, the purpose of the general user tray 100 is to store the semiconductor components SC, so in order to carry as many semiconductor components SC as possible, the row spacing a and the column spacing b between the semiconductor components SC are designed to be minimum. [0004] Additionally, if figure 2 As shown, the row sp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/36G01R31/26H01L21/66H01L21/67
CPCG01R31/2867G01R31/2893H01L21/687
Inventor 朴荣大
Owner TECHWING CO LTD
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