Storage equipment and control method thereof

A technology of a storage device and a control method, applied in the storage field, can solve the problems of reducing the writing speed of a semiconductor storage device, the operation time occupied by an effective page, etc., and achieve the effects of reducing the number of empty block recovery times and improving the data writing speed.

Inactive Publication Date: 2010-07-07
NETAK TECH KO LTD
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, when empty blocks are reclaimed during the above-mentioned process of writing data, the relocation of valid pages tak

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Storage equipment and control method thereof
  • Storage equipment and control method thereof
  • Storage equipment and control method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] figure 1 Shown is a storage device 1 in an embodiment of the present invention, the storage device 1 includes a controller 11 and at least one semiconductor storage medium 12 , and may also include a memory 13 . As previously mentioned, the memory 13 can be a random access memory inside the controller 11 of the storage device (such as figure 1 shown), it may also be a synchronous DRAM external to the controller 11.

[0026] figure 2 show figure 1 Controller 11 shown. The controller 11 includes a first unit 111 and a second unit 112, wherein:

[0027] The first unit 111 establishes the mapping relationship between some logical addresses of the storage device 1 and the physical addresses of the empty blocks in the semiconductor storage medium 12 , and records the information of the empty blocks without mapping relationship in the semiconductor storage medium 12 .

[0028] The second unit 112 operates on empty blocks without a mapping relationship.

[0029] In one e...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides storage equipment and a control method thereof. The storage equipment comprises a semiconductor storage medium. The method comprises the following steps of: establishing a mapping relationship of a partial logic address and a physical address of a semiconductor storage address hollow block; recording information of a hollow block without the mapping relationship; and operating the hollow block without the mapping relationship. The storage equipment and the control method thereof can effectively reduce the recovery times of the hollow block in the data write-in process, thereby improving the speed of writing in the data.

Description

technical field [0001] The present invention relates to memory technology, and more particularly, to memory technology in semiconductor memory devices. Background technique [0002] For semiconductor storage devices, such as flash memory devices, generally at least one flash memory medium is included. Flash media consists of a number of physical blocks. Each physical block has a physical address. In order to perform read and write operations on physical blocks, it is necessary to establish a mapping relationship between physical addresses and logical addresses. This mapping relationship is recorded in the address mapping table. [0003] Before the flash medium is used, all physical blocks are empty blocks (that is, physical blocks that do not contain any data). In order to improve the access speed, when establishing the mapping relationship between physical addresses and logical addresses, in addition to establishing a mapping relationship between all logical addresses a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F12/06
Inventor 卢赛文
Owner NETAK TECH KO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap