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Method and device for detecting micro foreign matter within transparent plate

A technology for transparent plates and foreign objects, which is used in measurement devices, optical devices, optical testing of flaws/defects, etc., which can solve the problems of high price, slow scanning speed, and large image data capacity.

Inactive Publication Date: 2012-05-09
AGC INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] Since Patent Documents 2 and 3 use a camera to capture the reflected image from an oblique direction, there is a problem that the field of view of the camera becomes larger, which causes the incidence of transmitted light and reflected light on the captured glass surface, making the detection unstable.
[0014] Moreover, when detecting tiny foreign objects, in order to obtain information about the shape and color of tiny foreign objects, the higher the resolution of the camera used, the better. However, the high-resolution camera is expensive and the capacity of the image data used is large. The speed of scanning the object is also slow

Method used

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  • Method and device for detecting micro foreign matter within transparent plate
  • Method and device for detecting micro foreign matter within transparent plate
  • Method and device for detecting micro foreign matter within transparent plate

Examples

Experimental program
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Effect test

Embodiment

[0088]In order to confirm the effectiveness of the method for detecting minute foreign matter of the present invention or the device thereof, the device of the present invention was produced, and NiS and bubbles in the glass plate were detected. However, the present invention is not limited to the following embodiments. As the laser beam irradiating means, a Class 2 laser with a wavelength of 635 nm, an energy of 1 mW, a wide angle of 78 degrees, and the ability to adjust the focus and line width of the laser beam was used. The area scan camera as the imaging part is a 1 / 3-type IT system PS CCD, and a black and white camera module capable of outputting VAG-level (640×480 pixels) images at 60fps (frame persecond) is mounted on a monochrome camera module with a focal length of 50mm and a display brightness A lens with an F value of 2.8. The angle between the incident direction of the laser beam and the normal line of the glass plate is 50 degrees, the width of the laser beam is...

example 1

[0091] Figure 11 and Figure 12 Middle shows the images of NiS detected with inner beam I and inner beam II. As a glass plate, a glass plate having a size of 300 mm×300 mm, a plate thickness of 6.8 mm, and an elliptical NiS having a major axis of 120 μm and a minor axis of 100 μm at a depth of 2.3 mm from the non-irradiated surface was prepared. The depth is a value based on the focal depth of NiS observed with a microscope.

[0092] Figure 11 is an image of the bright spots and bright lines produced by the internal beam I. The uppermost line in the image is the bright line A formed on the front surface of the glass as the illuminated surface, the point below the bright line A is the bright spot E of NiS, and the line below the bright spot E is the bright line B formed on the back surface of the glass. The line below B is hard to see, but is the bright line C formed on the front of the glass by reflection from the back of the glass. From this image, it was confirmed tha...

example 2

[0097] Figure 13 and Figure 14 The middle shows images of detected bubbles using inner beam I and inner beam II. As a glass plate, a glass plate having a size of 50 mm×50 mm, a plate thickness of 3 mm, and bubbles with a diameter of 200 μm at a depth of 1.0 mm from the non-irradiated surface was prepared. The depth is a value based on the depth of focus of bubbles observed with a microscope.

[0098] Figure 13 is an image of the bright spots and bright lines produced by the internal beam I. The uppermost line in the image is the bright line A formed on the front side of the glass as the illuminated surface, the point below the bright line A is the bright spot E of the bubble, the line below the bright spot E is the bright line B formed on the back side of the glass, and the bright line The line below B is hard to see, but is the bright line C formed on the front of the glass by reflection from the back of the glass. From this image, it was confirmed that the depth of t...

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Abstract

A light-blocking micro foreign matter within a transparent plate, if any, is stably detected and information on the depth of the micro foreign matter is acquired. A method is used for detecting a micro foreign matter (4), if any, present in a transparent plate (1) having a uniform index of refraction and a specific thickness by measuring bright spots (E, F) produced by scattering or the like of the projected light beam (2). The method is characterized in that the light beam (2) is made to enter the inside of the transparent plate at a predetermined angle of inclination with respect to the thickness direction of the transparent plate, thereby an inside light beam (I) entering the inside and an inside light beam (II) of when the inside light beam (I) is reflected by the surface of the transparent plate are produced inside the transparent plate, the transparent plate and the light beam (2) are relatively moved (in a direction G) without varying the entering angle of the light beam, the bright spots (E, F) produced when the same micro foreign matter is illuminated with the respective inside light beams (I, II) are measured in the thickness direction of the transparent plate, and the position of the micro foreign matter in the transparent plate is determined.

Description

technical field [0001] The present invention relates to a method and device for detecting tiny foreign matter inside a transparent plate such as a glass plate, and more particularly to a method and device for detecting tiny foreign matter such as nickel sulfide inside a glass plate. Moreover, this invention relates to the manufacturing method of a glass plate including the process based on the method of detecting the minute foreign matter inside a glass plate. Background technique [0002] The tiny foreign matters inside the glass products are mainly translucent bubbles that transmit light, undissolved raw materials that block light, particles mixed into the glass, etc., which become defects of glass products and reduce yield. When glass products are strengthened by the so-called physical strengthening method that introduces compressive stress on the surface after heating the glass, it is particularly effective in the case of nickel sulfide (hereinafter referred to as "NiS")...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/958G01B11/22
CPCG01N21/896G01N2021/8905G01N21/00G01N2021/8967G01N21/94G01N21/958
Inventor 大音仁昭
Owner AGC INC
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