Sorting machine and sorting testing method

A sorting test and sorting machine technology, applied in the direction of electronic circuit testing, sorting, etc., can solve the problems of manpower consumption, time consumption, lack of efficiency, etc., and achieve the effect of reducing misjudgment and saving setup costs

Inactive Publication Date: 2010-08-11
PRINCETON TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Developing this classification technology with today's technology is not only time-consuming, labor-intensive, but also inefficient

Method used

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  • Sorting machine and sorting testing method
  • Sorting machine and sorting testing method
  • Sorting machine and sorting testing method

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Embodiment Construction

[0041] The advantages and spirit of the present invention can be further understood through the following detailed description of the invention and the accompanying drawings.

[0042] see figure 2 , figure 2 is a functional block diagram of the sorter 3 according to a specific embodiment of the present invention. According to this specific embodiment, the classifier 3 of the present invention includes a classifier 30 and a test module 32 , and the test module 32 is detachably connected to the classifier 30 . In other words, the test module 32 can be built in the classifier 30; or, the test module 32 is a cartridge, and the classifier 30 has a slot corresponding to the cartridge, so that the test module 32 and the classifier 30 can be conveniently connected. Plug in and out. However, the structure of the classifier 30 is as described in the prior art and will not be repeated here. In addition, if figure 2 As shown, the test module 32 of the present invention includes a ...

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PUM

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Abstract

The invention provides a sorting machine and a sorting testing method. The sorting machine comprises a sorter and a testing module, wherein the testing module further comprises a signal generator, an inductor and a signal comparator. The signal generator generates and sends out a first sorting signal, the sorter receives the first sorting signal and accordingly arranges a first electronic element in a first area for sorting according to the first sorting signal, the inductor induces the first electronic element arranged in the first area and accordingly generates and sends out a second sorting signal, and the signal comparator is electrically connected with the inductor and the signal generator, receives the first sorting signal and the second sorting signal and accordingly sends out a comparison signal by judging whether the first sorting signal is identical to the second sorting signal. The invention saves the arrangement costs of a tester and cables and further lessens the artificial false judgment.

Description

technical field [0001] The present invention relates to a sorter and a testing method thereof, and in particular, the present invention relates to a sorting machine capable of automatically sorting integrated circuits (integrated circuits, ICs) and an automatic testing method thereof. Background technique [0002] The IC test sorter is mainly used in the latter part of the semiconductor test process. It is an automated mechanical structure that can test and classify ICs. see figure 1 , figure 1 It is a schematic diagram showing an existing IC test sorter 1 . A conventional IC test sorter 1 includes a sorter 10 , a tester 12 and a plurality of cables 14 . The existing IC testing sorter 1 is composed of a sorter 10 and a testing machine 12 electrically connected by cables 14 . Wherein, the classifier 10 may further include a tray or a tube. When the sorter 10 performs the sorting action, the integrated circuits to be tested are sorted and placed on standard container tray...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/00G01R31/28
Inventor 滕贞勇甘少天陈昱升
Owner PRINCETON TECHNOLOGY
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