Analog-to-digital joint type data acquisition device

A data acquisition, analog-to-digital technology, applied in analog/digital conversion, signal transmission systems, instruments, etc., can solve problems such as inability to achieve high-speed data acquisition, limited acquisition system bandwidth, and long range automatic switching time.

Inactive Publication Date: 2010-12-15
HENAN UNIV OF SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this method limits the bandwidth of the acquisition system and cannot achieve high-speed data acquisition
Because changing the gain of the amplifying circuit requires a certain process and response time, after the gain of the amplifying ci

Method used

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  • Analog-to-digital joint type data acquisition device
  • Analog-to-digital joint type data acquisition device
  • Analog-to-digital joint type data acquisition device

Examples

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Embodiment Construction

[0015] Taking N=4 parallel analog amplification and conditioning circuits as an example to describe the analog-digital combined data acquisition device of the present invention in detail, the system schematic diagram of the device is as follows figure 1 shown. The analog-digital combined data acquisition device includes a first-stage analog amplification and conditioning circuit, a parallel multi-channel analog amplification and conditioning circuit, an AD sampling module and a digital control module. The N-channel input terminals of the amplification and conditioning circuit are connected, the N-channel output terminals of the parallel multi-channel analog amplification and conditioning circuit are respectively connected with the N-channel analog input terminals of the AD sampling module, and the AD sampling module is connected with the digital control module through a control port.

[0016] When N=4, the circuit diagram of the acquisition device is as follows figure 2 show...

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Abstract

The invention relates to an analog-to-digital joint type data acquisition device, belonging to the technical field of data acquisition. The device of the invention comprises a first-stage analog amplifying and conditioning circuit, a parallel multiplex analog amplifying and conditioning circuit, an AD sampling module and a digital control module, wherein the parallel multiplex analog amplifying and conditioning circuit comprises an N-way amplifying and conditioning circuit formed by connecting two operational amplifiers in series; the output end of the first-stage analog amplifying and conditioning circuit is connected with N input ends of the parallel multiplex analog amplifying and conditioning circuit; N output ends of the parallel multiplex analog amplifying and conditioning circuit are respectively connected with N analog input ends of the AD sampling module; and the AD sampling module is connected with the digital control module through a control port. The acquisition device canintellectually realize automatic switchover of a measuring range according to the size of analog input signals, ensures the sampling accuracy, enlarges the dynamic range, does not need extra time forautomatic switchover of the measuring range, improves the sampling rate, and ensures the band width of a system.

Description

technical field [0001] The invention relates to an analog-digital combined data acquisition device which adopts the combination of an analog circuit and a digital control circuit, and belongs to the technical field of data acquisition. Background technique [0002] When measuring with a sensor, sometimes the measured size is unknown, and the test circuit cannot choose an appropriate magnification at the beginning. When the measured value changes from small to large, if the selected magnification is small, a large sampled value of the measured value can be obtained, but the sampled value obtained from a small measured value is very small, and accurate measurement cannot be realized; if the selected magnification When the multiple is large, small measurands can be accurately sampled, but the correct sampling value cannot be obtained for large measurands due to exceeding the range. Therefore, as the analog value changes during the measurement process, the magnification and ran...

Claims

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Application Information

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IPC IPC(8): H03M1/54
Inventor 韩红彪库祥臣李济顺马伟段明德贾现召
Owner HENAN UNIV OF SCI & TECH
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