Applicant regional-ranking analysis system and analysis method

An analysis system, the applicant's technology, applied in special data processing applications, instruments, electronic digital data processing, etc., can solve the problems of inconvenient patent analysis, lack of patent ranking analysis methods, and inability to visually display the applicant's patent ranking. , to achieve the effect of improving efficiency and accuracy

Inactive Publication Date: 2011-03-30
J Z M C INTPROP DATA SCI & TECH
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  • Abstract
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Problems solved by technology

[0003] Among the current analysis methods for applicant rankings in the market, there is a lack of analysis methods for patent rankings in specific regions, an

Method used

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  • Applicant regional-ranking analysis system and analysis method
  • Applicant regional-ranking analysis system and analysis method
  • Applicant regional-ranking analysis system and analysis method

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Embodiment Construction

[0012] Such as figure 1 Shown is a block diagram of the applicant's regional ranking analysis system according to the present invention. The applicant area ranking analysis system provides a patent database analysis topic establishment module and an applicant area ranking analysis module. The applicant area ranking analysis module includes an applicant area selection module, an applicant quantity selection module, a display control module and a result display module . According to the number of applicants selected by the user and the region where the applicants are located, the applicant regional ranking analysis module performs statistical analysis on the patent data of such applicants, generates different applicant regional ranking analysis results, and displays them on the display module in the form of graphics . The present invention can intuitively and quickly count the ranking situation of the applicant area concerned by the user.

[0013] Further, the applicant area ...

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Abstract

The invention provides an applicant regional-ranking analysis system and an applicant regional-ranking analysis method. The system of the invention is based on a patent database, a user instruction module and a display terminal. The applicant regional-ranking analysis system comprises a patent database analysis special subject establishing module, an applicant region selection module, an applicant number selection module, a display control module and a result display module. The method comprises the following steps of: 1) establishing the patent database; 2) retrieving and establishing a patent analysis special subject in the patent database; 3) selecting the region of analyzed applicants from the patent analysis special subject by using the applicant region selection module; 4) selecting the number of the analyzed applicants in the patent analysis special subject by using the applicant number selection module; and 5) displaying the ranking diagram of the applicants in the selected region and number by using the display control module and the result display module. The system and the method can directly and quickly count the regional ranks of the applicants a user pays attention to.

Description

technical field [0001] The invention relates to a patent information processing system and method, in particular to an applicant region ranking analysis system and analysis method. Background technique [0002] With the rapid development of science and technology and the increasingly fierce competition among enterprises, analyzing, researching and utilizing patent information has become one of the important means for enterprises to benefit from competition and maintain a favorable competitive position. The analysis of patent information can help enterprises understand the number of patent applications of the industry and competitors in a certain period of time, and the ranking in this field, so as to understand the distribution of technical patents in this field and the situation of patent monopoly. [0003] Among the current analysis methods for applicant rankings on the market, there is a lack of patent ranking analysis methods for specific regions, and it is impossible to...

Claims

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Application Information

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IPC IPC(8): G06F17/30
Inventor 唐向东魏国柱
Owner J Z M C INTPROP DATA SCI & TECH
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