Annular light source test platform
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- GUDENG PRECISION IND CO LTD
- Publication Date
- 2011-04-13
- Estimated Expiration
- Not applicable Β· inactive patent
Smart Images
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Abstract
Description
technical field
[0001] The invention relates to electromechanical devices, and aims to provide a ring-shaped light source inspection platform, especially a ring-shaped light source inspection platform that can effectively inspect particles on a photomask to improve the quality of inspection objects. Background technique
[0002] Wafers are the most important material for manufacturing semiconductors, and the main raw material for manufacturing wafers is silicon dioxide. The wafers undergo hundreds of processing procedures such as deposition, etching, heating, photoresist treatment, coating, and development. A single wafer can produce tens or even hundreds of integrated circuit semiconductors according to its different sizes, and in order to produce wafers with different circuits and electronic components, a photomask is required for pre-design.
[0003] A photomask can be said to be a mold for making a wafer. When an integrated circuit company designs a circuit design for a ...