Jumper board

Abstract

The invention discloses a jumper board which comprises a substrate, a signal terminal, a wiring terminal and a switching chip, wherein the signal terminal and the wiring terminal are formed on the substrate; the switching chip is connected to the substrate; the switching chip comprises a plurality of input ends, a plurality of output ends and a multiway switch; the input ends are electrically connected with the signal terminal; the output ends are electrically connected with the wiring terminal; and the multiway switch controls the connection and disconnection between any input end and any output end. Thus, for different types of integrated circuit products, the jumper board provided by the invention can control the state of the multiway switch only by programming, so as to realize the connection between the signal terminal and the wiring terminal, thereby meeting the testing requirements.

Description

technical field [0001] The invention relates to the field of electronic components, in particular to a jumper board. Background technique [0002] The testing of integrated circuit products usually requires the use of corresponding test machines and test boards, such as HAST boards for high-accelerated temperature and humidity stress tests (HAST) and product life cycle tests. Aging board (burn-in board) and so on. Generally, the test board includes a test socket, a signal terminal socket and a terminal socket. The test socket is used to place the test chip, the signal terminal socket is electrically connected to the test signal input terminal, and the terminal socket is electrically connected to the pins of the test chip. The jumper board is usually used in conjunction with the test board, and its function is to control the test signal to be added to the test pin of the test chip according to the test requirements. [0003] Please also refer to Figure 1 to Figure 4 , Fi...

AI Technical Summary

Problems solved by technology

This leads to a low reuse rate of jumper boards and a serious waste of resources, and the increase in the number of jumper boards will increase the storage burden (the pins of the jumper boards are easily deformed and broken, and foam protection is required)

Moreover, due to the long cycle of making jumper boards, the preparation time for new integrated circuit product testing is correspondingly longer

In addition, the long-term plugging and unplugging of the jumper board will cause great damage to the test board and affect the test effect

Images