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Opening device for test handler

A technology for testing a sorter and an open device, which is applied to measurement devices, single semiconductor device testing, semiconductor/solid-state device testing/measurement, etc., and can solve problems such as inability to properly operate the anti-separation device, damage to the insert, and complicated operations. , to achieve the effect of easy replacement, prevent damage, and improve operating rate

Active Publication Date: 2011-05-18
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0017] Therefore, when the existing opening device 100 replaces the opening plate 120, the operation is very cumbersome and wastes a lot of time.
[0018] In addition, in order for the opening pin p of the opening plate 120 to properly operate the anti-separation device of the insertion part, it is necessary for the opening plate 120 to form a proper surface contact with the carrier plate, but if the horizontal state of the opening plate 120 and the carrier plate is different, the opening pin p Not only will the anti-disengagement device cannot be properly manipulated, but the insertion part may be damaged

Method used

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Examples

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Embodiment Construction

[0037] The preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. For the sake of brevity, repeated descriptions or descriptions of known technologies will be omitted or compressed as much as possible.

[0038] Figure 2a is a perspective view of an opening device 200 according to the present invention, Figure 2b yes Figure 2a An exploded perspective view of the opening device 200 of FIG.

[0039] The opening device 200 according to the present embodiment includes a lifting module 210, an opening plate 220, an air cylinder 230, and the like.

[0040] The lifting module 210 includes a lifting plate 211, a mounting plate 212, two bolts 213, four springs 214, and the like.

[0041] The lifting plate 211 has a rectangular shape and directly receives the driving force of the cylinder 230, and two thread grooves 211a are formed on both sides thereof.

[0042] The installation plate 212 has the same rectangular sh...

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PUM

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Abstract

The invention relates to an opening device for a test handler. The opening device for the test handler comprises a lifting module, which is configured to be capable of ascending and descending and is equipped with an operation part; an opening plate, wherein a lower surface has an installation part and an upper surface has multiple opening pins which enable to open an insertion part of a carrier plate, the installation part is disposed at the upper side of the lifting module and is lifted up and down with the elevation of the lifting module, and according to the operation state of a manager on the operation part, the formation of the state of installation to the lifting module may enable to release the installation state; and a driving part providing a driving force for lifting the lifting module up and down. According to the invention, the installation which enables to easily assemble and disassemble the opening pate is disclosed, thereby making the replacement of the opening plate easier. In addition, the carrier plate and the opening plate are located at different level conditions, and a proper surface contact between the carrier plate and the opening plate is allowed, further preventing the damage to the insertion part.

Description

technical field [0001] The invention relates to an opening device for a test sorting machine, in particular to an opening device for a test sorting machine with the desorption technology of an open plate. Background technique [0002] For testing of electronic components (particularly semiconductor elements), a tester for testing electrically connected electronic components and a test handler for electrically connecting the electronic components to the tester are required. [0003] In order to increase the processing capacity of the test handler, a carrier board (carrier board) for transporting a plurality of semiconductor elements loaded in rows and columns is used at one time. The carrier is provided with a plurality of inserts arranged in rows and columns, and semiconductor elements are loaded on the carrier in a state of being inserted into the inserts. [0004] Usually, the semiconductor device tested by the test handler is provided in the state loaded in the user tray...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/344G01R31/26H01L21/66
CPCG01R31/2601G01R31/2867
Inventor 罗闰成具泰兴黄正佑
Owner TECHWING CO LTD
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