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Special SCM (Single Chip Machine) controller for detecting defects of woven fabric

A detection control system, woven fabric technology, applied in the program control of sequence/logic controller, electrical program control, etc.

Inactive Publication Date: 2011-06-15
JIANGNAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, after using digital image processing technology to complete the defect detection of woven fabrics, there is no clear solution on how to identify the defects and perform preliminary processing.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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  • Special SCM (Single Chip Machine) controller for detecting defects of woven fabric
  • Special SCM (Single Chip Machine) controller for detecting defects of woven fabric
  • Special SCM (Single Chip Machine) controller for detecting defects of woven fabric

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] The entire woven fabric defect detection controller is mainly composed of 89C52 single-chip microcomputer system, and the woven fabric defect detection processor is mainly composed of a single-chip microcomputer, storage body, communication interface and keyboard display, etc., which are used to receive, store and process woven fabrics during work. The block diagram of defect data is shown in Figure 2. When the defect data of the woven fabric is changed, the system microcomputer is used to input the defect data through the RS232 interface and store it in the defect processor of the woven fabric.

[0017] The woven fabric defect memory is used to store defect data, using AM29F016D flash memory with a capacity of 1.5M bytes; keyboard and display are used to input woven fabric structure parameters and other working parameters; RS-232 serial communication interface receives The defect data transmitted from the host computer; the single-chip microcomputer is responsible for ...

example 2

[0021] The entire woven fabric defect detection controller is mainly composed of 8086 single-chip microcomputer system, and the fabric defect processor is mainly composed of a single-chip microcomputer, storage body, communication interface and keyboard display, etc., which are used to receive, store and process fabric defect data during work. The composition block diagram is shown in Figure 4. When the fabric defect data is changed, the processed fabric defect data is stored in the U disk, and the fabric defect data of the U disk is read into the memory of the fabric defect processor through the USB interface.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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PUM

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Abstract

The invention relates to a special SCM (Single Chip Machine) controller for detecting defects of a woven fabric, which belongs to the field of novel textile machinery. Because a variety of defects exist in the woven fabric, and a detection algorithm is complicated, when the defects are detected, a specific defect treating process needs to be selected according to the varieties and relevant features of the defects, and a simple single software treatment method obviously can not meet the requirement for real-time control of defect detection. For solving the technical problem, a SCM is used as the core of a control system and used for reading in the varieties and the relevant features of the defects and then controlling a subsequent defect treating process of the woven fabric so that the requirement for real-time control of the defect defection is met, and therefore the treating process of the defects of the woven fabric is accomplished.

Description

technical field [0001] The invention relates to the development of a special control system for woven fabric defect detection with a single-chip microcomputer as the core, specifically relates to the use of a single-chip microcomputer to read the type of woven fabric defect and related characteristic data and store the information in the memory, and use the data to control the action of the stepping motor in real time. The control of the defect detection and processing mechanism to achieve the effect of real-time processing of defects. Background technique [0002] During the production process of woven fabrics, due to the yarn and weaving process, defects such as slubs, missing warps, missing wefts, holes, and oil stains will be formed on the cloth surface. After the woven fabric is produced, the computer digital image processing technology can be used to locate the fabric defect and extract the characteristic parameters of the fabric defect to classify the defect. After c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/04
Inventor 潘如如刘基宏王鸿博高卫东刘建立
Owner JIANGNAN UNIV
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