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Measuring and correcting lens distortion in a multispot scanning device

A technology of distortion function and information processing equipment, which is applied in the field of multi-spot optical scanning microscope and multi-spot optical scanning equipment, can solve the problems of false image and intensity mismatch in digital images, and achieve image improvement, image quality maintenance and strong barrel distortion. Effect

Inactive Publication Date: 2011-07-06
KONINK PHILIPS ELECTRONICS NV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

As a result, the intensities near the dots of the lattice do not correspond to the intensities near the blobs and will appear as artifacts in the digital image

Method used

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  • Measuring and correcting lens distortion in a multispot scanning device
  • Measuring and correcting lens distortion in a multispot scanning device
  • Measuring and correcting lens distortion in a multispot scanning device

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Embodiment Construction

[0071] image 3 depicted in the above reference figure 1 Sensitive area 44 of image sensor 34 is depicted. Also indicated is an image spot 46 focused on the sensitive region 44 by means of the imaging optics 32 . also indicated with figure 1 The Bravais lattice 8 of the probe spot 6 shown in is geometrically similar to the auxiliary Bravais lattice 46 . The size and orientation of the auxiliary lattice 48 is chosen such that its lattice points, i.e. the intersection points of the lines for the example lattice 48, coincide with the image spot 48 in the region surrounding the central point of the sensitive area 44, which is the imaging system The optical axis (not shown) of 34 cuts the point of sensitive area 44 . It should be emphasized that the image spot 46 is tangible, and the auxiliary dot matrix 48 is an abstract concept. A simple way to determine the readout point on the sensitive area 44 is to select the lattice point of the auxiliary dot matrix 48 as the readout po...

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Abstract

The invention provides a method of determining the distortion of an imaging system (32), the imaging system having an object plane (40) and an image plane (42). The method comprises the steps of determining (204) the positions of the image light spots (46) on a sensitive area (44) of an image sensor (34) by analyzing the image data; and fitting (205) a mapping function such that the mapping function maps the lattice points of an auxiliary lattice (48) into the positions of the image light spots (46), wherein the auxiliary lattice (48) is geometrically similar to the Bravais lattice (8) of the probe light spots (6). The invention also provides a method of imaging a sample, using an imaging system (32) having an object plane (40) and an image plane (42), the method comprising the steps of determining (304) readout points on the sensitive area (44) of an image sensor (34) by applying a mapping function to the lattice points of an auxiliary lattice (48), the auxiliary lattice being geometrically similar to a Bravais lattice (8) of probe light spots (6); and reading (305) image data from the readout points on the sensitive area (44). Also disclosed are a measuring system (10) for determining the distortion of an imaging system, and a multispot optical scanning device (10).

Description

technical field [0001] The invention relates to a method of determining distortion of an imaging system having an object plane and an image plane. [0002] The invention also relates to a measurement system for determining the distortion of an imaging system having an object plane and an image plane, the measurement system comprising: a spot generator for generating in the object plane an array of probe spots according to a one-dimensional or a two-dimensional Bravais lattice arrangement; an image sensor having a sensitive area arranged to interact with the array of image spots; and an information processing device coupled to the image sensor. [0003] The invention also relates to methods of imaging a sample using an imaging system having an object plane and an image plane. [0004] The invention also relates to a multi-spot optical scanning device, in particular a multi-spot optical scanning microscope, comprising: an imaging system having an object plane and an image plane...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02G02B21/00G02B27/00
CPCG02B21/002G02B27/0031G01M11/0264
Inventor B·胡什肯S·斯托林加
Owner KONINK PHILIPS ELECTRONICS NV