Integrated automated testing system based on subsystems

Abstract

The invention relates to an integrated automated testing system based on subsystems, and is characterized in that a public support system is utilized to perform integration, so that the testing system is divided into the subsystems with different granularities; a communication technology is adopted to realize effective testing and data collection for a plurality of network types; the concept of system on module is adopted in the public support system, so that a central processing unit (CPU), a memory, a storage cell, Flash, an operating system, an IO (Input / Output) and a controlled unit are directly integrated on a hardware module, thus each hardware module constitutes one subsystem which is capable of performing independent operation; the subsystems are incorporated into a common bus by related interfaces, so that each other hardware module in the testing system can carry out interaction with the common bus to realize resource sharing; and among the subsystems, a distributed computing technology is adopted, a plurality of CPUs are cooperated, a plurality of tested objects are subjected to parallel processing, and data is subjected to centralized processing, thus forming the complete automated testing system. The automated testing system has the advantages of low power consumption, miniaturized volume, strong expansion capability and the like.

Description

Technical field [0001] The invention relates to the field of information technology, in particular to an automated test system based on subsystem integration. Background technique [0002] With the continuous development of wireless networks and the continuous improvement of network quality requirements, traditional manual drive tests and fixed-point manual tests not only consume a lot of manpower and material resources, but also cannot meet the increasing needs of network operators for network monitoring and optimization. With the help of the rapid development and organic combination of computer technology and communication technology, a large number of manual tests in the past have been gradually replaced by automated test systems, such as automatic drive test systems and automatic dial test systems. [0003] The main idea of ​​the traditional automated test system is to provide services for different functions through a centralized processing unit. The main structure is compose...

AI Technical Summary

Problems solved by technology

Due to the limitations of hardware processing capabilities and volumes such as CPUs and motherboards in the past, most test systems designed in this way have problems such as low efficiency and bulky products.

Therefore, the automatic test system has significant deficiencies in many aspects such as system structure and power consumption control, which makes it extremely difficult to popularize and apply such equipment, and problems emerge in endlessly

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