Sampling and measuring apparatus for microspectrophotometer and application method thereof
A technology of spectrophotometer and measuring device, which is applied in the direction of measuring device, sampling device, color/spectral characteristic measurement, etc., which can solve the problems of micro-change of optical path length and correction of difficult micro-change, so as to improve accuracy and realize automatic correction , Ease of use
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Embodiment 1
[0047] figure 1 Shown is a schematic structural view of the sampling measurement device of the present invention, including an upper measurement platform 4 and a lower measurement platform 5 connected by a central axis 11, and the upper measurement platform 4 can be rotated and opened along the central axis 11; one is fixed on the upper The projection fiber seat 3 of the measurement platform 4, a receiving fiber seat 6 fixed on the lower measurement platform 5, the projection fiber seat 3 and the receiving fiber seat 6 are inserted with optical fibers inside, when the upper measurement platform 4 is closed, the upper measurement platform 4 It is parallel to the lower measurement platform 5 and aligned up and down; a sample groove for accommodating samples to be tested is formed between the projecting fiber base 3 and the receiving fiber base 6 .
[0048] On the upper measuring platform 4, a first jacking wire 1 is vertically penetrated vertically to the upper measuring platfo...
Embodiment 2
[0073] figure 2 Shown is a schematic view of the structure of a sampling and measuring device with two jackscrews. The difference between its structure and the structure described in Example 1 is that the sampling and measuring device is also provided with a second jacking wire 2, and the specific setting position is: in the On the above-mentioned measuring platform 4, a second jacking wire 2 is vertically penetrated vertically to the upper measuring platform 4. With respect to the end of the upper measuring platform 4 towards the lower measuring platform 5, the first jacking wire The bottom end of 1 is lower than the bottom end of the second top wire 2.
[0074] Figure 5-1 , Figure 5-2 It is a diagram of the working state of the sampling measurement device in this embodiment at two optical path lengths. Figure 5-1 For the working state of the device at the maximum optical distance, firstly, the electromagnet magnetic cylinder 9 is de-energized, and the lifting seat 7 r...
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Abstract
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