Testing module for adapter element

Abstract

The invention relates to a testing module for an adapter element, which comprises an adapter element to be tested, an artificial card and a debugging plate. The artificial card is electrically connected with the adapter element; the debugging plate is respectively connected with the adapter element and the artificial card; moreover, a loops is formed between the debugging plate and the adapter element as well as the artificial card; and the debugging plate judges whether the adapter element is normal or not through a test signal transmitted in the loop.

Description

technical field [0001] The present invention relates to a test module, in particular to a test module of an adapter element. Background technique [0002] figure 1 A schematic block diagram of a known technology test adapter is shown. Because the connection specification of the PCI-E slot 800 of the server is not yet directly compatible with the high-end PCI-E adapter card 700 supporting the Mobile PCI Express module (Mobile PCI Express Module MXM) (such as a high-end graphics adapter card or video image adapter card). Therefore, it is necessary to insert the high-end PCI-E adapter card 700 on an adapter element 200, and then connect the adapter element 200 to the PCI-E slot 800 of the server, as the high-end PCI-E adapter card 700 and A bridge for server exchange signals. [0003] Before the server equipped with such a high-end PCI-E adapter card 700 is shipped, the quality of the adapter element 200 must be ensured to avoid increasing subsequent maintenance costs and a...

AI Technical Summary

Problems solved by technology

[0005] 1. When the test server is used to perform functional tests on the adapter components, there are a large number of human-computer interaction testing tasks, which are not only inefficient, but also often cause test failures due to errors in human judgment.

[0006] 2. When the test server is used to perform functional tests on the adapter components, the high-end PCI-E adapter card, the adapter elements to be tested and the PCI-E slot must be reinstalled for each test, which is quite labor-intensive and time-consuming

[0007] 3. When the test server is used to perform functional tests on the adapter components, a fixed start-up time is required to cooperate with the startup of the server, which in turn prolongs the overall test time of the adapter elements, thereby affecting production costs and product quality

[0008] 4. When the physical product with high-end PCI-E adapter card is used for functional testing of adapter components, due to the powerful function of high-end PCI-E adapter card, the current price in the market is quite expensive. Therefore, if the above When the adapter component is a defective product, it will often damage the high-end PCI-E adapter card or server, resulting in a significant loss of value

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