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Stamped mark width measuring device and method

A technology of width detection and imprint, which is applied in the field of liquid crystal, can solve the problems of low measurement efficiency, heavy workload, and low accuracy, and achieve the effect of improving accuracy, improving measurement efficiency, and eliminating repeated operations

Active Publication Date: 2011-11-23
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This method of taking samples of the width of the indentation in a part of the area to represent the width of the entire substrate indentation is not very accurate; if the accuracy is improved by measuring the width of the indentation in a larger area with the naked eye, it will cause a large workload and reduce the measurement efficiency

Method used

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  • Stamped mark width measuring device and method
  • Stamped mark width measuring device and method
  • Stamped mark width measuring device and method

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Embodiment Construction

[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0022] An embodiment of the present invention provides a device for detecting the width of an indentation mark, including a supporting mobile structure that supports and drives an image acquisition device to move, and the image acquisition device is used to obtain an image of an indentation mark on the substrate to be tested;

[0023] The indentation width detection device further includes a measuring system for measuring the indentation width in the indentation ima...

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Abstract

The invention discloses a stamped mark width measuring device and method, relating to the technical field of liquid crystal and solving the problems of low rate of accuracy and low efficiency of measuring stamped mark width in the prior art. The stamped mark width measuring device disclosed by the invention comprises a supporting and moving structure which is used for supporting and driving an image acquiring device to move; the image acquiring device is used for acquiring stamped mark images on a substrate to be measured; and the stamped mark width measuring device further comprises a measuring system which is used for measuring stamped mark width of the stamped mark images. The invention is mainly applied to production of liquid crystal panels.

Description

technical field [0001] The invention relates to the technical field of liquid crystals, in particular to a device and method for detecting the width of an impression mark (Nip). Background technique [0002] In the current liquid crystal display technology, the liquid crystal panel includes a thin film transistor (TFT) array substrate and a color filter substrate (Color filter), and liquid crystals are dripped between the TFT array substrate and the Color filter substrate, and the TFT array substrate and the Color filter substrate are in contact with the TFT array substrate and the color filter substrate. An alignment film is formed on the surface where the liquid crystal contacts, and the alignment film has zigzag grooves. The method for forming the grooves is generally to coat a layer of polyimide (PI) film on the surface of the substrate, and form grooves with a certain orientation on the PI film through a rubbing process. The liquid crystal molecules are arranged along ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/02G02F1/13
Inventor 宋勇志鲁姣明王煦罗会月
Owner BOE TECH GRP CO LTD
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