Light emission component testing tool and applied circuit thereof
A technology for optical emission components and test tooling, applied in the field of optical communication, can solve the problems of evaluation, detection, increase the difficulty of research and development, lack of component performance data collection, etc., and achieve the effect of good versatility
Active Publication Date: 2011-11-23
SICHUAN XINYISHENG COMM TECH CO LTD
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Problems solved by technology
Therefore, the existing optical emission component debugging technology cannot effectively manage the optical emission component. When the evaluation test manufacturer is replaced or the performance of the optical emission component produced by the same batch is different, the evaluation and detection cannot be made in time, which will affect the production. debugging
R&D and production must spend a lot of time re-matching new laser components, and the debugging efficiency is low
At the same time, there is a lack of collection of component performance data, and it is impossible to make improvement suggestions to the manufacturer
The R&D department does not have a component testing platform, which increases the difficulty of R&D
Method used
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[0046] All features disclosed in this specification, or steps in all methods or processes disclosed, may be combined in any manner, except for mutually exclusive features and / or steps.
[0047] Any feature disclosed in this specification (including any appended claims, abstract and drawings), unless expressly stated otherwise, may be replaced by alternative features which are equivalent or serve a similar purpose. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.
[0048] Such as figure 1 The optical emission component testing tooling shown includes an external signal interface unit, a microprocessor unit, a radio frequency signal input interface unit, an optical emission component drive unit, an optical emission component matching unit, a test port and a power supply unit.
[0049] The power supply unit is used to supply power to the microprocessor unit and the light emitting component drive unit, and ...
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The invention discloses a light emission component testing tool and an applied circuit thereof, which relate to the field of light communication, in particular to a tool for testing the performance of a light emission component. The invention aims to overcome the defects of the conventional light emission component testing technology and provide a complete and independent light emission component testing tool and an applied circuit thereof. Design key points of the invention are that: the light emission component testing tool mainly comprises a microprocessor unit, a radiofrequency signal input interface unit, a light emission component driving unit and the like, wherein the microprocessor unit is used for controlling the control over the entire testing work and acquiring testing parameters; the light emission component driving unit is used for providing modulating current and a biasing voltage signal necessary for work to a tested light emission component; and the light emission component testing tool, a data acquisition, analysis and storage unit, a signal generator and a testing instrument constitute a light emission component testing circuit. The light emission component testing tool is mainly used for testing and managing the working performance and parameters of the light emission component.
Description
technical field [0001] The invention relates to the field of optical communication, in particular to a tool for testing the performance of light emitting components. Background technique [0002] TO-CAN: A form of packaging for optoelectronic devices. [0003] The 10G optical transmission component is used in the telecommunications core switching network and is one of the key components of XFP and SFP+. The function of this component is to convert electrical signals into optical signals. The 10G optical transmission component consists of three parts: TO-CAN, coupling piece and connecting soft board. Debugging the optical emission components to make their couplings and TO-CAN achieve a better cooperation state, and testing parameters such as modulation, bias current and extinction ratio are essential links in the actual production and application of optical emission components. Consider the following three reasons: [0004] 1. When the coupling part does not cooperate well...
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IPC IPC(8): H04B10/08G01M11/00H04B10/071H04B10/079H04B10/50
Inventor 张维黄晓雷
Owner SICHUAN XINYISHENG COMM TECH CO LTD