A test structure and method of fpga internal connection resources

Abstract

The invention relates to a test structure for interconnect resources in a field programmable gate array (FPGA). The test structure is a built-in self test structure; a test pattern generator (TPG), an output response analyser (ORA) and a circuit under test (CUT) are composed of internal resources of the FPGA; and the whole test structure is realized by writing a test configuration program for configuring the FPGA. A test method for the interconnect resources in the FPGA comprises the following six steps of: 1, arranging configuration logic blocks (CLBs); 2, configuring the TPG; 3, configuring the ORA; 4, configuring the CUT; 5, establishing a readback file by using an FPGA development platform, running the FPGA, reading analysis result data saved in a trigger in the ORA, and detecting and positioning a fault; and 6, repeating the steps 1-5, and completing four-time configuration of dual-long-line resources with CLB rank, intelligent long-line resources, dual-long-line resources without CLB rank and intelligent long-line resources and a final test according to the distribution of the CLBs and the type of the CUT.

Description

technical field [0001] The invention relates to a test structure and method of an FPGA (Field Programmable Gate Array, Field Programmable Gate Array) internal connection resource, and belongs to the technical field of FPGA internal connection testing. Background technique [0002] There are abundant routing resources inside the FPGA device. Taking Xilinx's Spartan 3 series as an example, its wiring resources include long-line resources, intelligent long-line resources, double long-line resources and direct interconnection line resources. [0003] Long-term resources include 24 horizontal long-terms and 24 vertical long-terms. These long wire resources are bidirectional and run through the entire device, such as figure 1 As shown, the outputs of every six interconnect blocks are connected to this routing resource. [0004] There are eight intelligent long-line resources in the east, west, south, and north directions, which are the same length as the long lines. The output...

AI Technical Summary

Problems solved by technology

Since the test time of FPGA depends almost entirely on the number of configurations, the test time of this method is too long, which is not conducive to practical application

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