Regulatable X-ray pseudo-thermal light source based on microporous membrane

Abstract

The invention discloses a high-brightness regulatable X-ray pseudo-thermal light source based on a microporous membrane. The high-brightness regulatable X-ray pseudo-thermal light source comprises a homogeneous X-ray generation system and a pseudo-thermal X-ray regulation cavity, which are arranged in a radiation-prevention shell, wherein the homogeneous X-ray generation system comprises an oscillator, a white-light slit and a bicrystal monochromator which are arranged coaxially; and the pseudo-thermal X-ray regulation cavity comprises a regulatable slit group, a microporous membrane and a motion controller thereof, and an X-ray emergent window which are arranged coaxially. Thermal X-rays generated by the oscillator are propagated to arrive at the white-light slit firstly, are subjected to bundle limitation, then enter the bicrystal monochromator, and are subjected to monochromation by the bicrystal monochromator to form homogeneous X-rays, the homogeneous X-rays are radiated to the pseudo-thermal X-ray regulation cavity, sequentially pass through the regulatable slit group and the microporous membrane fixed on a base plate in the cavity, and form dynamic X-ray speckles behind themicroporous membrane under the control of the motion controller of the microporous membrane, and then the dynamic X-ray speckles are emergent from the X-ray emergent window, thus, a X-ray pseudo-thermal light field is formed. The high-brightness regulatable X-ray pseudo-thermal light source has the characteristics of suitability to an X-optical band, high resolution, high brightness, regulation availability and good stability.

Description

technical field [0001] The invention relates to an X-ray source, in particular to a high-brightness controllable X-ray pseudothermal light source based on a microporous film, which can be used as an X-ray source in the field of X-ray intensity correlation imaging. Background technique [0002] In intensity-correlated imaging applications, an important issue is the need to obtain a detectable thermo-optic field. For the short coherence time of thermal light, the existing photodetectors cannot measure the instantaneous intensity of thermal light fluctuations. In 1964, Martienssen et al. invented a continuous pseudothermal light source [see W.Martienssen and E.Spiller, "Coherence and Fluctuations in Light Beams", American Journal of Physics 32, 8 (1964)]. In 2006, in order to overcome the problem that the continuous pseudothermal light source does not meet the cross-spectrum purity conditions of the real thermal optical field, Han Shensheng and others from the Shanghai Institu...

AI Technical Summary

Problems solved by technology

For the short coherence time of thermal light, the existing photodetectors cannot measure the instantaneous intensity of thermal light fluctuations. In 1964, Martienssen et al. invented a continuous pseudothermal light source [see W.Martienssen and E.Spiller, "Coherence and Fluctuations in Light Beams", American Journal of Physics 32, 8 (1964)]

In 2006, in order to overcome the problem that the continuous pseudothermal light source does not meet the cross-spectrum purity conditions of the real thermal optical field, Han Shensheng and others from the Shanghai Institute of Optics and Fine Mechanics of the Chinese Academy of Sciences invented a high-brightness pulsed pseudothermal light source (invention patent No. ZL200710036968.X)

[0004] 2. X-rays have a short wavelength and high penetrability. There is no suitable space transformation modulation element, and the ground glass scattering effect cannot be used to obtain pseudothermal speckles.

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