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Sample heating device used in integrating-sphere reflectivity measurement

A heating device and reflectivity technology, which is applied in the preparation of test samples, etc., can solve the problem of not being able to measure reflectivity at high temperature, and achieve the effects of uniform and stable sample temperature, convenient operation and simple design.

Inactive Publication Date: 2012-04-25
CHINA JILIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The object of the present invention is to provide a sample heating device for measuring the reflectance of an integrating sphere, so as to solve the deficiency that the existing integrating sphere reflectance measuring device cannot measure the reflectance at high temperature

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  • Sample heating device used in integrating-sphere reflectivity measurement
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  • Sample heating device used in integrating-sphere reflectivity measurement

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Embodiment Construction

[0020] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0021] like figure 1 As shown, a sample heating device structure for measuring the reflectance of an integrating sphere includes three parts: a constant temperature heating device 1 , a radiation heat transfer device 2 and a temperature control device 3 .

[0022] like figure 1 , figure 2 As shown, the constant temperature heating device 1 includes a copper rod 10 wrapped with an insulating material 9, a resistance wire 8 and a resistance regulator 15; 15 are connected in series, and the whole constant temperature heating device 1 will be wrapped with thermal insulation asbestos 11;

[0023] like figure 1 , image 3 As shown, the radiant heat transfer device 2 includes a ceramic sleeve 7, the inner hole of the ceramic sleeve 7 is coated with a high-emissivity (emissivity>0.995 coating) paint 18, and one side of the ceramic sleeve 7 is fixed on a c...

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Abstract

The invention discloses a sample heating device used in integrating-sphere reflectivity measurement. The sample heating device comprises a copper bar, a heat-insulating ceramic shell, a resistance wire, a temperature controller and a K-type thermocouple, wherein, the copper bar is wrapped with an insulating material and then wound with the resistance wire, and the resistance wire is connected with a resistance regulator in series and then is connected with the temperature controller; one side of the copper bar is used for fixing a ceramic tube sleeve, high-emissivity coating is coated on one side of the copper bar and all over the ceramic tube sleeve to obtain a blackbody cavity, and a test sample is heated by radiation of the blackbody cavity; the test sample is fixed at the other side of the ceramic tube sleeve; the K-type thermocouple is fixed on a vertical side surface of the test sample and is taken as a temperature sensor to be connected with the temperature controller so as to regulate and control the heating time of the resistance wire; and the heat-insulating ceramic shell is fixed outside the whole heating device. The sample heating device has the beneficial effects thatthe sample can be stably heated in reflectivity measurement, the problem that the existing integrating-sphere reflectivity test device can only test the sample at room temperature is solved, and the heat-insulating ceramic shell plays a role in protecting the integrating-sphere reflectivity test device.

Description

technical field [0001] The invention relates to a sample heating device, in particular to a sample heating device for measuring the reflectivity of an integrating sphere. Background technique [0002] Integrating sphere reflectance measurement is an important method to obtain the emissivity of target materials and coatings. Infrared thermal imaging cameras and pyrometers need to input the emissivity of the target material into the temperature measuring instrument to obtain the real temperature of the surface of the target material. However, the emissivity of materials at different temperatures is different. The current method of measuring the reflectance of the integrating sphere to derive the emissivity can only measure the reflectance at room temperature, and cannot measure the reflectance at high temperature, so the current emissivity database is not complete, and the data of radiation temperature measurement is not accurate. Contents of the invention [0003] The obj...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/44
Inventor 孙坚赵泉钦陈乐徐红伟谢敏王晓川
Owner CHINA JILIANG UNIV
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