Automatic test system and method thereof

Abstract

The invention discloses an automatic test system and a method thereof. The automatic test system comprises a device group with a plurality of devices and an electronic device which comprises an input unit, a storage unit, a controller, an output unit and an integration transmission interface. The input unit is used for inputting an instruction. The controller is connected to the input unit and the storage unit. According to the instruction, the controller loads the instruction into the storage unit to control and start an automatic test program and transmits a test instruction. One end of the integration transmission interface is connected to the controller, and the other end of the integration transmission interface is connected with the device group. The integration transmission interface is used for integrating test instructions and transmitting the test instructions to one of the devices, and automatic test work is carried out. According to the system and the method in the invention, manually carrying out related operations on the device group is not needed, manually carrying out subsequent data analysis and statistical work also is not needed, thus manual work time is reduced, test time can be greatly reduced, product test efficiency is raised, and advantages of automation, accuracy, low cost, high efficiency and the like are achieved.

Description

technical field [0001] The invention relates to an automatic test system and method, in particular to an automatic test system capable of collaborative processing and a method thereof. Background technique [0002] The power supply is the most indispensable electronic component in electronic products. In order to ensure the product quality and other conditions of the power supply, a large number of tests and verifications must be passed during the design and manufacturing process of the power supply to ensure that each The quality of a product can meet the requirements of customers. [0003] With the development trend of electronic products, power supplies are also equipped with various new functions. However, the more functions, the more items need to be tested and inspected. At present, when conducting product development and testing of power supplies, there are many types of tests and items. The machines for each test item have different parameter settings, and most of t...

AI Technical Summary

Problems solved by technology

Moreover, after the relevant test operations are completed, it is still necessary for the staff to manually integrate the test results together, or convert some test results into relevant statistical charts, and compile them into a consolidated report for storage or Provide customers with confirmation and verification. In this way, it not only consumes manpower and testing time, but also reduces the overall testing efficiency

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