Laser pulse single particle effect simulation system

Abstract

The invention discloses a laser pulse single particle effect simulation system which belongs to an integrated circuit radiation technology field. The simulation system comprises: an ultrafast laser pulse generation system, a test system and a controller. In the simulation system, a piezoelectric ceramic rotary table is used. Through a rotation ability of the piezoelectric ceramic rotary table, a laser can accurately scan on a detected device. In the laser pulse single particle effect test system, the scanning can be realized only if a displacement table and a chip installed on the table are moved. By using the system of the invention, the above problem can be solved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit radiation, in particular to a laser pulse single event effect simulation system. Background technique [0002] The single event effect hardening level of integrated circuits is one of the important indicators of radiation-resistant integrated circuits. Accelerator, the main test equipment for single event effect, is expensive, lacks machine time, and high test cost. It is mainly used for product assessment, and it is difficult to meet the requirements of fine research. In order to solve this problem, the U.S. Naval Laboratory (NRL) developed a laser pulse single event effect test system, which greatly supports the research work of single event effects, but unfortunately, due to the need for a stage to move To realize laser scanning in different areas of the device, the device needs to be installed on the radio frequency package, which greatly increases the cost of use, and cannot solv...

AI Technical Summary

Problems solved by technology

Accelerator, the main test equipment for single event effect, is expensive, short of machine time, and high in testing costs. It is mainly used for product assessment, and it is difficult to meet the requirements of fine research.

In order to solve this problem, the U.S. Naval Laboratory (NRL) developed a laser pulse single event effect test system, which greatly supports the research work of single event effects, but unfortunately, due to the need for a stage to move To realize laser scanning in different areas of the device, the device needs to be installed on the RF package, which greatly increases the cost of use, and cannot solve the problem of electrostatic damage, thus limiting the use of this technology for device reference, and it is difficult to meet the needs of industrial applications

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