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Self-test work method of contact circuit board test system

A test system and working method technology, applied in the direction of electronic circuit testing, etc., can solve the problems of limiting the number of test nodes, slow detection speed, etc., and achieve the effect of improving self-test and detection, good scalability, and strong anti-interference ability.

Active Publication Date: 2014-06-18
ZHONGWEI ELECTRONICS INSTR FACTORY ZHANGZHOU CITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the existing design, the triode switch array is controlled by relays, which severely limits the number of test nodes and the detection speed is slow

Method used

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  • Self-test work method of contact circuit board test system
  • Self-test work method of contact circuit board test system
  • Self-test work method of contact circuit board test system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] like figure 1 , a contact circuit board testing system, comprising: a computer interface M0, the FPGA circuit in the triode switch array control circuit is connected to the computer interface M0; the output end of the FPGA circuit is connected to the triode switch array; The triode switch array includes at least two groups of paired transistor circuits, the paired transistor circuit includes a PNP type and an NPN type transistor, the collectors of the PNP type and NPN type transistors are connected, and each PNP type transistor in the triode array circuit The emitters of the transistors are connected to form the first common point GND1, and the emitters of the NPN transistors in the transistor array circuit are connected to form the second common point GND2. The terminal connected to the electrodes is the test node J; the two common points of the triode switch array are respectively connected to a controlled current source, and the current generated by the controlled cu...

Embodiment 2

[0110]Self-test function, used to detect the working condition of the triode switch circuit. Control the base of the triode so that any group of triodes is turned on, and the voltage between the two points AB is:

[0111] u AB =U ecs +U ces =2u ces (12)

[0112] Among them: U ecs , U ces is the saturated conduction voltage drop of the triode, U ecs =U ces , let U ecs +U ces = 2U ces . Obviously, by detecting the detection voltage U between two points AB AB , you can judge the working condition of the triode.

[0113] To test the functional principle, the base of the triode is controlled by the FPGA, so that the triode is cross-conducted to ensure that the PNP and NPN transistors in each pair of tubes are not turned on at the same time, and the voltage between the two points AB is:

[0114] u AB =(U ecs +U ces )+I x R x = 2U ces +I x R x (13)

[0115] Get R from formula (2) x :

[0116] R x = ...

Embodiment 3

[0125] On the basis of embodiment 1, the detection working method of the contact circuit board testing system of the present embodiment comprises the following steps:

[0126] ① Place the standard circuit board horizontally on the test platform of the contact circuit board test system, so that all the probes connected to the test node J of the triode switch array are in contact with the standard circuit board;

[0127] 2. Control the second FPGA circuit M5 by computer to cut off the NPN transistors in any pair of transistor circuits in the transistor array, and make the rest of the NPN transistors in the transistor switch array fully conduct; and the computer controls the first FPGA The circuit M4 makes the PNP-type transistors in the pair of tube circuits conduct, and the remaining PNP-type transistors in the transistor switch array are all cut off, and the test node J in the pair of tube circuits is set as a test reference point;

[0128] ③ If there is no detection voltage ...

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Abstract

The invention relates to a self-test work method of a contact circuit board test system. The system comprises a computer interface, first and second FPGA (field programmable gate array) circuits which are connected with the computer interface, and a transistor switch array circuit which at least comprises two groups of pair transistor circuits and is connected with control signal output ends of the first and second FPGA circuits, wherein the pair transistor circuit comprises a PNP (Positive-Negative-Positive) type transistor and an NPN (Negative-Positive-Negative) type transistor, and the collectors of the PNP type transistor and the NPN type transistor are connected. According to the self-test work method, many test nodes are arranged, the FGPA circuit has good scalability, an effective benchmark test point can be quickly found, and a node grid based on the point can be obtained; and the anti-interference ability is strong, and the volt-ampere relation of a node network can not be affected by drain current or drain voltage.

Description

technical field [0001] The invention relates to a self-inspection working method of a contact circuit board test system Background technique [0002] In the modern electronics industry, printed circuit boards have been widely used, and various methods for detecting the quality of circuit boards have emerged due to the urgent needs of the industry. The contact detection of the circuit board can be understood as the computer-controlled automatic online detection ICT (In-CircuitTester). The tested circuit board is fixed on the test platform fixture through a pneumatic mechanism, and n tested Measuring points (usually the number of n is determined by the number of pads or vias on the circuit board), through full contact with the probes connected to the test nodes in the triode switch array and the pads or vias, the triode switch array and Its control circuit is the key to system testing, and the paired circuit composed of PNP and NPN transistors is the most basic unit circuit t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 徐煜明韩雁徐斐庄燕滨
Owner ZHONGWEI ELECTRONICS INSTR FACTORY ZHANGZHOU CITY
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