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Assessment method of electronic complete machine acceleration service life

A technology that accelerates the life of the whole machine, and is applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., and can solve the problems that it is impossible to establish an accelerated model, and achieve the effect of less samples and high reliability

Inactive Publication Date: 2012-06-20
BEIHANG UNIV
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  • Abstract
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Problems solved by technology

For electronic complete machines, it is even more impossible to establish an acceleration model using the above method

Method used

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  • Assessment method of electronic complete machine acceleration service life
  • Assessment method of electronic complete machine acceleration service life
  • Assessment method of electronic complete machine acceleration service life

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Embodiment Construction

[0126] The content of the above invention has an excellent effect on solving the problem of accelerated evaluation of the life of the whole machine. At present, this method is very effective for electronic whole machines. For other products such as electromechanical, photoelectric, and electromechanical fluids, this method can also be improved. It has a certain practical effect.

[0127] The implementation steps of the present invention will be set forth in detail below:

[0128] See figure 1 , the present invention is a kind of accelerated life evaluation method of electronic whole machine, and the concrete steps of this method are as follows:

[0129] Step 1: Establish a priori distribution model for specific products. By analyzing specific products, inferring the life of the product, establishing several assumptions, and obtaining the prior failure rate, figure 2 and image 3 is the prior failure rate in the experiment. figure 2 no step time, image 3 There is a ste...

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Abstract

An assessment method of electronic complete machine acceleration service life includes four steps: step1, determining prior failure rate of products according to various standards, actual experiment information and expert information; step2, determining parameter value in an order Dirichlet model according to obtained prior failure rate; step3, conducting acceleration service life experiments on the products and determining likelihood function capable of well indicating experiment information according to experiment modes and results; step4, calculating posterior distribution from the prior information and the likelihood function to obtain posterior reliability and failure rate and accordingly obtain service life characteristics of an electronic complete machine. The assessment method is scientific in conception, resolves the actual problems of lack of acceleration model and less complete machine samples, is a system grade acceleration assessment method and provides reliable evidence for improvement of product assessment period and accuracy.

Description

(1) Technical field [0001] The invention relates to a calculation method for life characteristics and reliability characteristics of a system complete machine level product, in particular to an accelerated life evaluation method for an electronic complete machine. For the very small sample of the whole machine, and the characteristics of the acceleration equation cannot be obtained, the Bayesian posterior statistical method is used to deal with the life evaluation of the complex machine, which belongs to the field of applied mathematics and reliability engineering. (2) Background technology [0002] Based on the development of modern scientific and technological level, the requirements for product reliability are getting higher and higher, and it is impossible to evaluate the life and reliability of products in a short time. The development of accelerated life test provides a better solution to this problem. Accelerated life testing has been carried out in a series of resear...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 姚军周秀峰邓清张俊徐明鸽赵帅帅
Owner BEIHANG UNIV
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